Test Date: 2014-02-17 12:02
R0110 ModuleFulltest_m15_1
Chips

Overview

Vcal Threshold
Summary 1
Module Module R0110
Grade Grade B
PixelDefects Pixel Defects - A/B/C 50 - 0/1/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 0
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 1
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2014-02-17
TestTime Test Time 12:02
TempC Temparature -15 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 103.33 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 57.75 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.01 %
RelGainWidthROCs Rel. Gain W. grades 0/1/0
PedestalSpread Pedestal Spread 103.00 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.46
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150 I_rec(150 V) @ 17°C 0.13 μA
CurrentAtVoltage150_ORIG I_orig(150V) @ -15.0 °C 0.01 μA
CurrentVariation I(150 V) / I(100 V) 1.11
IVCurve
CurrentAtVoltage150 I_orig(150V) @ -15.0 °C 0.01 μA
Variation I(150 V) / I(100 V) 1.11
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.13 μA
Noise
mu μ 103.33
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 103.00
Parameter1
mu μ 0.46
Temperature Analysis
MeanTemperature MeanTemperature 0 ± 0 degC
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 50 0 0 1 50 0 0 0 0 0 0
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