Test Date: 2014-02-17 12:02
Chip 0
Pixel Map: C0
SCurveWidths
Plot
N N 4155
mu μ 206.65
sigma σ 27.76
VcalThresholdUntrimmed
Vcal Threshold Trimmed
Plot
N N 4160
mu μ 40.05
sigma σ 2.31
Bump Bonding Problems: C0
Bump Bonding: C0
Plot
Mean Mean 62.0
RMS RMS 5.74
nSigma σ 5.0
Threshold threshold 90.71
nBumpBondingProblems N BumpProblems 1.0
Trim Bit Test
Summary
Total Total 50
nDeadPixel Dead Pixels 0
nNoisy1Pixel Noisy Pixels 1 0
nMaskDefect Mask Defects 0
nDeadBumps Dead Bumps 1
nDeadTrimbits Dead Trimbits 50
nAddressProblems Address Problems 0
nNoisy2Pixel Noisy Pixels 2 0
nThrDefect Trim Problems 0
nGainDefect PH Gain defects 0
nPedDefect PH Pedestal defects 0
nPar1Defect PH Parameter1 Defects 0
PixelDefectsGrade Pixel Defects Grade ROC 2
Address Decoding: C0
PHCalibrationGain
Plot
N N 4028
mu μ 5.03
sigma σ 0.15
over >= 131.00
Par1N Par1 N 4160
Par1mu Par1 μ 0.91
Par1sigma Par1 σ 0.04
PHCalibrationPedestal
Plot
N N 4159
mu μ 42.26
sigma σ 4.12
Trim Bits
PH Calibration Gain Map
OpParameters
Vana Vana 103 DAC
CalDel CalDel 116 DAC
VthrComp VthrComp 71 DAC
Vtrim Vtrim 29 DAC
Ibias_DAC Ibias_DAC 130 DAC
VoffsetOp VoffsetOp N/A DAC