Test Date: 2015-10-29 13:58
Analysis date: 2015-10-30 19:00
M3022 ModuleFulltestPxar_m20_2
Chips

Overview

_
Summary 1
Module Module M3022
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 48 - 16/0/0
DeadPixels Dead Pixels 15
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 12
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 22
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 3
PHGainDefects PH Gain Defects 5
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 19
Summary 2
TestCenter Test Center ETH
TestDate Test Date 2015-10-29
TestTime Test Time 13:58
TestDuration Test Duration 1:16:02
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 388.3 mA
Summary 3
Noise Noise 134.58 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 45.78 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1120.53 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.72
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.80 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.02 μA
CurrentVariation I(150 V) / I(100 V) 1.66
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.02 μA
Variation I(150 V) / I(100 V) 1.66
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.80 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.66
CurrentRatio100V I(+17C)/I(-20C) 100V 49.10
CurrentRatio150V I(+17C)/I(-20C) 150V 33.54
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:16:02
MinCurrent min. Current 0.361 A
MaxCurrent max. Current 0.527 A
Analog Current
Duration Duration 1:16:02
MinCurrent min. Current 0.072 A
MaxCurrent max. Current 0.392 A
ModuleIa Module Ia 388.3 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.65
Min min 19.30
Max max 20.90
Temperature
Temperature Temp. while test -20.00 +/- 0.01 °C
Duration Duration of test 1:16:05
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
0
0
2
0
0
0
0
0
0
0
110.60
1749
42
0.028
952
Chip 1
A
2
0
0
2
0
0
0
0
0
0
0
146.02
1750
47
0.031
1248
Chip 2
A
2
1
0
0
0
0
0
1
0
0
2
137.53
1750
46
0.039
1186
Chip 3
A
4
0
0
1
0
0
0
3
0
0
1
136.62
1748
47
0.032
1475
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
133.17
1750
46
0.028
1038
Chip 5
A
3
0
0
3
0
0
0
0
0
0
0
136.29
1750
46
0.033
1200
Chip 6
A
5
4
0
1
0
0
0
0
0
0
4
141.64
1752
45
0.032
1003
Chip 7
A
6
5
0
1
1
0
0
1
1
0
5
127.60
1750
46
0.032
1090
Chip 8
A
5
3
0
2
0
0
0
0
0
0
3
135.02
1751
46
0.035
1003
Chip 9
A
2
1
0
1
1
0
0
0
2
0
0
133.72
1751
46
0.028
1120
Chip 10
A
2
1
0
0
0
0
0
1
0
0
2
133.40
1754
48
0.033
1377
Chip 11
A
1
0
0
1
0
0
0
0
0
0
0
131.43
1748
46
0.037
1100
Chip 12
A
5
0
0
1
0
0
0
4
1
0
1
137.89
1750
46
0.031
942
Chip 13
A
3
0
0
2
0
0
0
1
0
0
0
142.26
1748
47
0.032
1154
Chip 14
A
1
0
0
1
0
0
0
0
0
0
0
134.18
1748
44
0.033
1040
Chip 15
A
5
0
0
4
1
0
0
1
1
0
1
135.87
1749
45
0.044
1000
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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