Test Date: 2015-06-26 09:57
Analysis date: 2015-10-28 15:43
M3017 ModuleFulltest_p17_2
Chips

Overview

_
Vcal Threshold
Summary 1
Module Module M3017
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 68 - 16/0/0
DeadPixels Dead Pixels 19
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 16
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 29
NoisyPixels Noise Defects 1
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 4
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 29
BumpBondingMap
Summary 2
TestCenter Test Center CERN
TestDate Test Date 2015-06-26
TestTime Test Time 09:57
TestDuration Test Duration 0:59:07
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x84 0x49
TBM2 TBM2 ok, 0x00 0x49
PxarVersion pXar v2.2.4+51 gdb2a247
ModuleIa Module Ia 379.4 mA
Summary 3
Noise Noise 141.39 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 56.28 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1253.75 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.69
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.59 μA
CurrentVariation I(150 V) / I(100 V) 1.10
IVCurve
Plot
CurrentAtVoltage150V I(150 V) 0.59 μA
Variation I(150 V) / I(100 V) 1.10
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 0:59:07
MinCurrent min. Current 0.445 A
MaxCurrent max. Current 0.473 A
Analog Current
Plot
Duration Duration 0:59:07
MinCurrent min. Current 0.36 A
MaxCurrent max. Current 0.383 A
ModuleIa Module Ia 379.4 mA
Temperature
Plot
Temperature Temp. while test 16.69 +/- 0.26 °C
Duration Duration of test 0:59:05
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
9
4
0
4
0
0
0
1
1
0
3
135.12
 1752
58
0.028
1344
Chip 1
A
6
4
0
2
0
0
0
0
0
0
4
138.86
 1754
58
0.028
1172
Chip 2
A
7
1
0
2
0
0
0
3
0
0
4
140.32
 1757
62
0.029
1710
Chip 3
A
5
0
0
2
0
0
0
2
0
0
3
126.90
 1754
55
0.028
1328
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
144.75
 1754
54
0.034
1054
Chip 5
A
8
0
0
2
0
0
0
6
0
0
4
143.72
 1752
63
0.027
1463
Chip 6
A
1
0
0
0
0
0
0
1
0
0
1
147.28
 1755
56
0.030
1168
Chip 7
A
4
0
0
1
0
0
1
1
1
0
1
142.85
 1750
56
0.031
1096
Chip 8
A
3
1
0
2
0
0
0
0
0
0
1
146.88
 1750
54
0.032
1272
Chip 9
A
5
0
0
3
0
0
0
2
0
0
1
150.41
 1748
56
0.033
1260
Chip 10
A
2
0
0
2
0
0
0
0
0
0
0
143.43
 1750
57
0.030
1198
Chip 11
A
4
0
0
4
0
0
0
0
0
0
0
144.36
 1753
56
0.033
1099
Chip 12
A
3
2
0
1
0
0
0
0
1
0
1
136.87
 1750
52
0.032
1050
Chip 13
A
5
4
0
1
0
0
0
0
0
0
4
141.02
 1747
54
0.035
1340
Chip 14
A
3
1
0
2
0
0
0
0
1
0
0
145.46
 1752
55
0.035
1256
Chip 15
A
3
2
0
1
0
0
0
0
0
0
2
133.99
 1752
56
0.044
1250
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x49
Core0a_basee Core 0a base e 0x84
Core0b_basea Core 0b base a 0x49
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 1
RocDelay_Ch1 Roc Delay Ch1 1
RocDelay_Ch2 Roc Delay Ch2 1
RocDelay_Ch3 Roc Delay Ch3 1
Phase400 Phase 400 1
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 18
nWarnings # Warnings 56
channel_0_count Channel 0 0
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 13
message_eventid_count Event ID mismatch 5
message_readback_count Readback start marker 56
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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