Test Date: 2015-10-29 13:48
Analysis date: 2015-10-30 19:12
M3017 ModuleFulltestPxar_m20_2
Chips

Overview

_
Summary 1
Module Module M3017
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 55 - 16/0/0
DeadPixels Dead Pixels 19
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 5
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 30
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 4
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 19
Summary 2
TestCenter Test Center ETHZ
TestDate Test Date 2015-10-29
TestTime Test Time 13:48
TestDuration Test Duration 1:28:42
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar v2.6.0+26 g89693ff
ModuleIa Module Ia 385.9 mA
Summary 3
Noise Noise 127.32 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 45.16 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1159.84 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.73
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 0.00
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 0.00
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 0.00
CurrentRatio100V I(+17C)/I(-20C) 100V 70.34
CurrentRatio150V I(+17C)/I(-20C) 150V -1.00
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:28:42
MinCurrent min. Current 0.365 A
MaxCurrent max. Current 0.534 A
Analog Current
Duration Duration 1:28:42
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.39 A
ModuleIa Module Ia 385.9 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.65
Min min 19.30
Max max 20.90
Temperature
Temperature Temp. while test -19.93 +/- 0.04 °C
Duration Duration of test 0:01:40
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
9
4
0
4
0
0
0
1
1
0
4
137.12
1747
47
0.031
1302
Chip 1
A
6
4
0
2
0
0
0
0
0
0
4
139.61
1748
46
0.032
1064
Chip 2
A
5
1
0
2
0
0
0
2
1
0
2
133.69
1750
50
0.036
1618
Chip 3
A
4
0
0
2
0
0
0
2
0
0
0
128.24
1750
48
0.030
1230
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
127.68
1752
43
0.030
958
Chip 5
A
2
0
0
2
0
0
0
0
0
0
0
138.89
1749
50
0.028
1369
Chip 6
A
0
0
0
0
0
0
0
0
0
0
0
132.96
1748
43
0.030
1080
Chip 7
A
2
0
0
1
0
0
0
0
1
0
0
129.40
1747
44
0.032
1013
Chip 8
A
3
1
0
2
0
0
0
0
0
0
1
117.90
1748
44
0.033
1179
Chip 9
A
3
0
0
3
0
0
0
0
0
0
0
113.77
1750
44
0.033
1126
Chip 10
A
2
0
0
2
0
0
0
0
0
0
0
129.28
1750
45
0.033
1066
Chip 11
A
5
0
0
5
0
0
0
0
0
0
0
126.62
1750
44
0.037
1019
Chip 12
A
3
2
0
1
0
0
0
0
0
0
2
108.82
1748
42
0.032
954
Chip 13
A
5
4
0
1
0
0
0
0
0
0
4
112.35
1749
43
0.036
1224
Chip 14
A
3
1
0
2
0
0
0
0
1
0
0
129.42
1749
44
0.033
1132
Chip 15
A
3
2
0
1
0
0
0
0
0
0
2
131.31
1748
46
0.045
1224
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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