Test Date: 2015-07-07 08:07
Chip 8
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 2/1
Efficiency Efficiency 50/120 99.88/99.32
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C8
InterpolatedEfficiency50 Interpol. Efficiency 50 99.88
InterpolatedEfficiency120 Interpol. Efficiency 120 99.32
Efficiency Distr. 150: C8
N N 4160
mu μ 98.87
sigma σ 1.76
Efficiency Distr. 250: C8
N N 4160
mu μ 96.95
sigma σ 3.43
Efficiency Distr. 100: C8
N N 4160
mu μ 99.58
sigma σ 0.95
Efficiency Distr. 50: C8
N N 4160
mu μ 99.89
sigma σ 0.49
Efficiency Distr. 200: C8
N N 4160
mu μ 97.33
sigma σ 3.15
Background Map 150: C8
RealHitrate Real Hitrate 132.46 MHz/cm2
Background Map 250: C8
RealHitrate Real Hitrate 186.84 MHz/cm2
Background Map 100: C8
RealHitrate Real Hitrate 91.65 MHz/cm2
Background Map 50: C8
RealHitrate Real Hitrate 45.21 MHz/cm2
Background Map 200: C8
RealHitrate Real Hitrate 179.85 MHz/cm2
Hit Map 50: C8
RealHitrate Real Hitrate 44.68 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 2
Bump Bonding Defects 50: C8
Hit Map 150: C8
RealHitrate Real Hitrate 131.91 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 150: C8
Col. Read. Unif. 50: C8
N N 6369886
mu μ 125083
sigma σ 353.67
Col. Read. Unif. 150: C8
N N 18845599
mu μ 369203
sigma σ 607.62
Read. Unif. over Time 50: C8
N N 7227000
mu μ 7322
sigma_th σ_th 85.57
Time unif. distribution 50: C8
chi2/ndf chi2/ndf 1.20
sigma σ 88.14
sigma_th σ_th 85.61
Read. Unif. over Time 150: C8
N N 21339438
mu μ 21621
sigma_th σ_th 147.04
Time unif. distribution 150: C8
chi2/ndf chi2/ndf 8.29
sigma σ 165.21
sigma_th σ_th 147.09
Col. Uniformity Ratio: C8
Col. Uniformity per Event: C8 50
Col. Uniformity per Event: C8 150
S-Curve widths: Noise (e^{-}) C8 100
N N 4060
mu μ 390.89
sigma σ 116.25
threshold thr 3416.12
fit_peak fit peak 338
fit_skewness ​ɣ​1 6.93e-01
under <= 32.00
over >= 68.00