Test Date: 2015-07-07 08:07
Chip 7
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 14/13
Efficiency Efficiency 50/120 99.87/99.37
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C7
InterpolatedEfficiency50 Interpol. Efficiency 50 99.87
InterpolatedEfficiency120 Interpol. Efficiency 120 99.37
Efficiency Distr. 150: C7
N N 4160
mu μ 99.08
sigma σ 1.50
Efficiency Distr. 250: C7
N N 4160
mu μ 97.52
sigma σ 2.99
Efficiency Distr. 100: C7
N N 4160
mu μ 99.62
sigma σ 0.90
Efficiency Distr. 50: C7
N N 4160
mu μ 99.90
sigma σ 0.45
Efficiency Distr. 200: C7
N N 4160
mu μ 97.80
sigma σ 2.76
Background Map 150: C7
RealHitrate Real Hitrate 127.73 MHz/cm2
Background Map 250: C7
RealHitrate Real Hitrate 179.03 MHz/cm2
Background Map 100: C7
RealHitrate Real Hitrate 88.06 MHz/cm2
Background Map 50: C7
RealHitrate Real Hitrate 43.12 MHz/cm2
Background Map 200: C7
RealHitrate Real Hitrate 172.36 MHz/cm2
Hit Map 50: C7
RealHitrate Real Hitrate 42.75 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 14
Bump Bonding Defects 50: C7
Hit Map 150: C7
RealHitrate Real Hitrate 125.35 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 13
Bump Bonding Defects 150: C7
Col. Read. Unif. 50: C7
N N 6145709
mu μ 153787
sigma σ 392.16
Col. Read. Unif. 150: C7
N N 18044031
mu μ 444293
sigma σ 666.55
Read. Unif. over Time 50: C7
N N 6914608
mu μ 7006
sigma_th σ_th 83.70
Time unif. distribution 50: C7
chi2/ndf chi2/ndf 4.26
sigma σ 95.33
sigma_th σ_th 83.74
Read. Unif. over Time 150: C7
N N 20277539
mu μ 20545
sigma_th σ_th 143.33
Time unif. distribution 150: C7
chi2/ndf chi2/ndf 5.77
sigma σ 161.00
sigma_th σ_th 143.39
Col. Uniformity Ratio: C7
Col. Uniformity per Event: C7 50
Col. Uniformity per Event: C7 150
S-Curve widths: Noise (e^{-}) C7 100
N N 3560
mu μ 451.57
sigma σ 159.97
threshold thr 3835.47
fit_peak fit peak 355
fit_skewness ​ɣ​1 8.54e-01
under <= 154.00
over >= 446.00