Test Date: 2015-07-07 08:07
Chip 4
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 19/19
Efficiency Efficiency 50/120 99.84/99.15
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C4
InterpolatedEfficiency50 Interpol. Efficiency 50 99.84
InterpolatedEfficiency120 Interpol. Efficiency 120 99.15
Efficiency Distr. 150: C4
N N 4160
mu μ 99.09
sigma σ 1.78
Efficiency Distr. 250: C4
N N 4160
mu μ 97.62
sigma σ 3.31
Efficiency Distr. 100: C4
N N 4160
mu μ 99.61
sigma σ 1.12
Efficiency Distr. 50: C4
N N 4160
mu μ 99.90
sigma σ 0.53
Efficiency Distr. 200: C4
N N 4160
mu μ 97.88
sigma σ 2.99
Background Map 150: C4
RealHitrate Real Hitrate 115.98 MHz/cm2
Background Map 250: C4
RealHitrate Real Hitrate 161.66 MHz/cm2
Background Map 100: C4
RealHitrate Real Hitrate 80.04 MHz/cm2
Background Map 50: C4
RealHitrate Real Hitrate 39.75 MHz/cm2
Background Map 200: C4
RealHitrate Real Hitrate 156.73 MHz/cm2
Hit Map 50: C4
RealHitrate Real Hitrate 39.56 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 19
Bump Bonding Defects 50: C4
Hit Map 150: C4
RealHitrate Real Hitrate 115.83 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 19
Bump Bonding Defects 150: C4
Col. Read. Unif. 50: C4
N N 5570991
mu μ 128740
sigma σ 358.80
Col. Read. Unif. 150: C4
N N 16366689
mu μ 376220
sigma σ 613.37
Read. Unif. over Time 50: C4
N N 6398533
mu μ 6483
sigma_th σ_th 80.52
Time unif. distribution 50: C4
chi2/ndf chi2/ndf 0.67
sigma σ 80.23
sigma_th σ_th 80.55
Read. Unif. over Time 150: C4
N N 18737797
mu μ 18985
sigma_th σ_th 137.78
Time unif. distribution 150: C4
chi2/ndf chi2/ndf 2.36
sigma σ 148.32
sigma_th σ_th 137.84
Col. Uniformity Ratio: C4
Col. Uniformity per Event: C4 50
Col. Uniformity per Event: C4 150
S-Curve widths: Noise (e^{-}) C4 100
N N 4123
mu μ 355.46
sigma σ 90.03
threshold thr 3461.48
fit_peak fit peak 321
fit_skewness ​ɣ​1 6.09e-01
under <= 13.00
over >= 24.00