Test Date: 2015-07-07 08:07
Chip 3
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 3/2
Efficiency Efficiency 50/120 99.85/99.29
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C3
InterpolatedEfficiency50 Interpol. Efficiency 50 99.85
InterpolatedEfficiency120 Interpol. Efficiency 120 99.29
Efficiency Distr. 150: C3
N N 4160
mu μ 98.95
sigma σ 2.74
Efficiency Distr. 250: C3
N N 4160
mu μ 97.40
sigma σ 3.85
Efficiency Distr. 100: C3
N N 4160
mu μ 99.54
sigma σ 2.39
Efficiency Distr. 50: C3
N N 4160
mu μ 99.85
sigma σ 2.24
Efficiency Distr. 200: C3
N N 4160
mu μ 97.59
sigma σ 3.77
Background Map 150: C3
RealHitrate Real Hitrate 122.64 MHz/cm2
Background Map 250: C3
RealHitrate Real Hitrate 170.78 MHz/cm2
Background Map 100: C3
RealHitrate Real Hitrate 84.82 MHz/cm2
Background Map 50: C3
RealHitrate Real Hitrate 42.48 MHz/cm2
Background Map 200: C3
RealHitrate Real Hitrate 166.17 MHz/cm2
Hit Map 50: C3
RealHitrate Real Hitrate 42.14 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 5
Bump Bonding Defects 50: C3
Hit Map 150: C3
RealHitrate Real Hitrate 122.56 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 4
Bump Bonding Defects 150: C3
Col. Read. Unif. 50: C3
N N 5939708
mu μ 158883
sigma σ 398.60
Col. Read. Unif. 150: C3
N N 17317218
mu μ 449799
sigma σ 670.67
Read. Unif. over Time 50: C3
N N 6816620
mu μ 6906
sigma_th σ_th 83.10
Time unif. distribution 50: C3
chi2/ndf chi2/ndf 1.44
sigma σ 88.12
sigma_th σ_th 83.14
Read. Unif. over Time 150: C3
N N 19827276
mu μ 20088
sigma_th σ_th 141.73
Time unif. distribution 150: C3
chi2/ndf chi2/ndf 4.95
sigma σ 152.71
sigma_th σ_th 141.79
Col. Uniformity Ratio: C3
Col. Uniformity per Event: C3 50
Col. Uniformity per Event: C3 150
S-Curve widths: Noise (e^{-}) C3 100
N N 3822
mu μ 427.85
sigma σ 143.86
threshold thr 3657.95
fit_peak fit peak 342
fit_skewness ​ɣ​1 8.38e-01
under <= 94.00
over >= 244.00