Test Date: 2015-07-07 08:07
Chip 2
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 2/1
Efficiency Efficiency 50/120 99.88/99.34
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C2
InterpolatedEfficiency50 Interpol. Efficiency 50 99.88
InterpolatedEfficiency120 Interpol. Efficiency 120 99.34
Efficiency Distr. 150: C2
N N 4160
mu μ 99.69
sigma σ 0.95
Efficiency Distr. 250: C2
N N 4160
mu μ 99.23
sigma σ 1.98
Efficiency Distr. 100: C2
N N 4160
mu μ 99.87
sigma σ 0.55
Efficiency Distr. 50: C2
N N 4160
mu μ 99.96
sigma σ 0.29
Efficiency Distr. 200: C2
N N 4160
mu μ 99.32
sigma σ 1.84
Background Map 150: C2
RealHitrate Real Hitrate 63.27 MHz/cm2
Background Map 250: C2
RealHitrate Real Hitrate 90.22 MHz/cm2
Background Map 100: C2
RealHitrate Real Hitrate 43.62 MHz/cm2
Background Map 50: C2
RealHitrate Real Hitrate 21.05 MHz/cm2
Background Map 200: C2
RealHitrate Real Hitrate 86.64 MHz/cm2
Hit Map 50: C2
RealHitrate Real Hitrate 20.94 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 2
Bump Bonding Defects 50: C2
Hit Map 150: C2
RealHitrate Real Hitrate 63.29 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 150: C2
Col. Read. Unif. 50: C2
N N 2796541
mu μ 51584
sigma σ 227.12
Col. Read. Unif. 150: C2
N N 8515782
mu μ 163878
sigma σ 404.82
Read. Unif. over Time 50: C2
N N 3386475
mu μ 3431
sigma_th σ_th 58.58
Time unif. distribution 50: C2
chi2/ndf chi2/ndf 0.96
sigma σ 59.47
sigma_th σ_th 58.60
Read. Unif. over Time 150: C2
N N 10239012
mu μ 10374
sigma_th σ_th 101.85
Time unif. distribution 150: C2
chi2/ndf chi2/ndf 1.90
sigma σ 106.46
sigma_th σ_th 101.89
Col. Uniformity Ratio: C2
Col. Uniformity per Event: C2 50
Col. Uniformity per Event: C2 150
S-Curve widths: Noise (e^{-}) C2 100
N N 3930
mu μ 415.88
sigma σ 128.71
threshold thr 3649.58
fit_peak fit peak 348
fit_skewness ​ɣ​1 7.75e-01
under <= 74.00
over >= 156.00