Test Date: 2015-07-07 08:07
Chip 15
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
4/3 |
|
Efficiency |
Efficiency 50/120 |
99.88/99.21 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C15
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.88 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.21 |
|
Efficiency Distr. 150: C15
N |
N |
4160 |
|
mu |
μ |
99.71 |
|
sigma |
σ |
0.80 |
|
Efficiency Distr. 250: C15
N |
N |
4160 |
|
mu |
μ |
99.32 |
|
sigma |
σ |
1.29 |
|
Efficiency Distr. 100: C15
N |
N |
4160 |
|
mu |
μ |
99.86 |
|
sigma |
σ |
0.54 |
|
Efficiency Distr. 50: C15
N |
N |
4160 |
|
mu |
μ |
99.95 |
|
sigma |
σ |
0.32 |
|
Efficiency Distr. 200: C15
N |
N |
4160 |
|
mu |
μ |
99.39 |
|
sigma |
σ |
1.20 |
|
Background Map 150: C15
RealHitrate |
Real Hitrate |
74.45 |
MHz/cm2 |
Background Map 250: C15
RealHitrate |
Real Hitrate |
104.28 |
MHz/cm2 |
Background Map 100: C15
RealHitrate |
Real Hitrate |
51.46 |
MHz/cm2 |
Background Map 50: C15
RealHitrate |
Real Hitrate |
25.41 |
MHz/cm2 |
Background Map 200: C15
RealHitrate |
Real Hitrate |
101.18 |
MHz/cm2 |
Hit Map 50: C15
RealHitrate |
Real Hitrate |
25.29 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
4 |
|
Bump Bonding Defects 50: C15
Hit Map 150: C15
RealHitrate |
Real Hitrate |
74.51 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
3 |
|
Bump Bonding Defects 150: C15
Col. Read. Unif. 50: C15
N |
N |
3559870 |
|
mu |
μ |
86406 |
|
sigma |
σ |
293.95 |
|
Col. Read. Unif. 150: C15
N |
N |
10521725 |
|
mu |
μ |
253154 |
|
sigma |
σ |
503.14 |
|
Read. Unif. over Time 50: C15
N |
N |
4091227 |
|
mu |
μ |
4145 |
|
sigma_th |
σ_th |
64.38 |
|
Time unif. distribution 50: C15
chi2/ndf |
chi2/ndf |
0.90 |
|
sigma |
σ |
67.22 |
|
sigma_th |
σ_th |
64.41 |
|
Read. Unif. over Time 150: C15
N |
N |
12052960 |
|
mu |
μ |
12212 |
|
sigma_th |
σ_th |
110.51 |
|
Time unif. distribution 150: C15
chi2/ndf |
chi2/ndf |
1.28 |
|
sigma |
σ |
114.88 |
|
sigma_th |
σ_th |
110.55 |
|
Col. Uniformity Ratio: C15
Col. Uniformity per Event: C15 50
Col. Uniformity per Event: C15 150
S-Curve widths: Noise (e^{-}) C15 100
N |
N |
4103 |
|
mu |
μ |
385.49 |
|
sigma |
σ |
113.18 |
|
threshold |
thr |
3376.33 |
|
fit_peak |
fit peak |
330 |
|
fit_skewness |
ɣ1 |
7.30e-01 |
|
under |
<= |
21.00 |
|
over |
>= |
36.00 |
|