Test Date: 2015-07-07 08:07
Chip 14
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
1/1 |
|
Efficiency |
Efficiency 50/120 |
99.84/98.99 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C14
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.84 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
98.99 |
|
Efficiency Distr. 150: C14
N |
N |
4160 |
|
mu |
μ |
99.68 |
|
sigma |
σ |
0.81 |
|
Efficiency Distr. 250: C14
N |
N |
4160 |
|
mu |
μ |
99.27 |
|
sigma |
σ |
1.27 |
|
Efficiency Distr. 100: C14
N |
N |
4160 |
|
mu |
μ |
99.86 |
|
sigma |
σ |
0.54 |
|
Efficiency Distr. 50: C14
N |
N |
4160 |
|
mu |
μ |
99.94 |
|
sigma |
σ |
0.33 |
|
Efficiency Distr. 200: C14
N |
N |
4160 |
|
mu |
μ |
99.35 |
|
sigma |
σ |
1.20 |
|
Background Map 150: C14
RealHitrate |
Real Hitrate |
69.24 |
MHz/cm2 |
Background Map 250: C14
RealHitrate |
Real Hitrate |
99.36 |
MHz/cm2 |
Background Map 100: C14
RealHitrate |
Real Hitrate |
47.31 |
MHz/cm2 |
Background Map 50: C14
RealHitrate |
Real Hitrate |
23.13 |
MHz/cm2 |
Background Map 200: C14
RealHitrate |
Real Hitrate |
95.11 |
MHz/cm2 |
Hit Map 50: C14
RealHitrate |
Real Hitrate |
22.72 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
1 |
|
Bump Bonding Defects 50: C14
Hit Map 150: C14
RealHitrate |
Real Hitrate |
68.53 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
1 |
|
Bump Bonding Defects 150: C14
Col. Read. Unif. 50: C14
N |
N |
3268569 |
|
mu |
μ |
53194 |
|
sigma |
σ |
230.64 |
|
Col. Read. Unif. 150: C14
N |
N |
9861075 |
|
mu |
μ |
168473 |
|
sigma |
σ |
410.45 |
|
Read. Unif. over Time 50: C14
N |
N |
3674677 |
|
mu |
μ |
3723 |
|
sigma_th |
σ_th |
61.02 |
|
Time unif. distribution 50: C14
chi2/ndf |
chi2/ndf |
0.96 |
|
sigma |
σ |
60.68 |
|
sigma_th |
σ_th |
61.04 |
|
Read. Unif. over Time 150: C14
N |
N |
11086054 |
|
mu |
μ |
11232 |
|
sigma_th |
σ_th |
105.98 |
|
Time unif. distribution 150: C14
chi2/ndf |
chi2/ndf |
0.96 |
|
sigma |
σ |
109.87 |
|
sigma_th |
σ_th |
106.02 |
|
Col. Uniformity Ratio: C14
Col. Uniformity per Event: C14 50
Col. Uniformity per Event: C14 150
S-Curve widths: Noise (e^{-}) C14 100
N |
N |
4160 |
|
mu |
μ |
207.21 |
|
sigma |
σ |
48.50 |
|
threshold |
thr |
2539.67 |
|
fit_peak |
fit peak |
202 |
|
fit_skewness |
ɣ1 |
2.00e-01 |
|