Test Date: 2015-07-07 08:07
Chip 14
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 1/1
Efficiency Efficiency 50/120 99.84/98.99
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C14
InterpolatedEfficiency50 Interpol. Efficiency 50 99.84
InterpolatedEfficiency120 Interpol. Efficiency 120 98.99
Efficiency Distr. 150: C14
N N 4160
mu μ 99.68
sigma σ 0.81
Efficiency Distr. 250: C14
N N 4160
mu μ 99.27
sigma σ 1.27
Efficiency Distr. 100: C14
N N 4160
mu μ 99.86
sigma σ 0.54
Efficiency Distr. 50: C14
N N 4160
mu μ 99.94
sigma σ 0.33
Efficiency Distr. 200: C14
N N 4160
mu μ 99.35
sigma σ 1.20
Background Map 150: C14
RealHitrate Real Hitrate 69.24 MHz/cm2
Background Map 250: C14
RealHitrate Real Hitrate 99.36 MHz/cm2
Background Map 100: C14
RealHitrate Real Hitrate 47.31 MHz/cm2
Background Map 50: C14
RealHitrate Real Hitrate 23.13 MHz/cm2
Background Map 200: C14
RealHitrate Real Hitrate 95.11 MHz/cm2
Hit Map 50: C14
RealHitrate Real Hitrate 22.72 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 50: C14
Hit Map 150: C14
RealHitrate Real Hitrate 68.53 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 150: C14
Col. Read. Unif. 50: C14
N N 3268569
mu μ 53194
sigma σ 230.64
Col. Read. Unif. 150: C14
N N 9861075
mu μ 168473
sigma σ 410.45
Read. Unif. over Time 50: C14
N N 3674677
mu μ 3723
sigma_th σ_th 61.02
Time unif. distribution 50: C14
chi2/ndf chi2/ndf 0.96
sigma σ 60.68
sigma_th σ_th 61.04
Read. Unif. over Time 150: C14
N N 11086054
mu μ 11232
sigma_th σ_th 105.98
Time unif. distribution 150: C14
chi2/ndf chi2/ndf 0.96
sigma σ 109.87
sigma_th σ_th 106.02
Col. Uniformity Ratio: C14
Col. Uniformity per Event: C14 50
Col. Uniformity per Event: C14 150
S-Curve widths: Noise (e^{-}) C14 100
N N 4160
mu μ 207.21
sigma σ 48.50
threshold thr 2539.67
fit_peak fit peak 202
fit_skewness ​ɣ​1 2.00e-01