Test Date: 2015-07-07 08:07
Chip 13
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
0/0 |
|
Efficiency |
Efficiency 50/120 |
99.86/99.29 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C13
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.86 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.29 |
|
Efficiency Distr. 150: C13
N |
N |
4160 |
|
mu |
μ |
99.52 |
|
sigma |
σ |
1.36 |
|
Efficiency Distr. 250: C13
N |
N |
4160 |
|
mu |
μ |
98.84 |
|
sigma |
σ |
2.75 |
|
Efficiency Distr. 100: C13
N |
N |
4160 |
|
mu |
μ |
99.79 |
|
sigma |
σ |
0.75 |
|
Efficiency Distr. 50: C13
N |
N |
4160 |
|
mu |
μ |
99.94 |
|
sigma |
σ |
0.39 |
|
Efficiency Distr. 200: C13
N |
N |
4160 |
|
mu |
μ |
98.93 |
|
sigma |
σ |
2.60 |
|
Background Map 150: C13
RealHitrate |
Real Hitrate |
72.51 |
MHz/cm2 |
Background Map 250: C13
RealHitrate |
Real Hitrate |
102.81 |
MHz/cm2 |
Background Map 100: C13
RealHitrate |
Real Hitrate |
49.51 |
MHz/cm2 |
Background Map 50: C13
RealHitrate |
Real Hitrate |
24.01 |
MHz/cm2 |
Background Map 200: C13
RealHitrate |
Real Hitrate |
98.32 |
MHz/cm2 |
Hit Map 50: C13
RealHitrate |
Real Hitrate |
24.02 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 50: C13
Hit Map 150: C13
RealHitrate |
Real Hitrate |
72.19 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 150: C13
Col. Read. Unif. 50: C13
N |
N |
3222574 |
|
mu |
μ |
159088 |
|
sigma |
σ |
398.86 |
|
Col. Read. Unif. 150: C13
N |
N |
9749232 |
|
mu |
μ |
452414 |
|
sigma |
σ |
672.62 |
|
Read. Unif. over Time 50: C13
N |
N |
3884752 |
|
mu |
μ |
3936 |
|
sigma_th |
σ_th |
62.74 |
|
Time unif. distribution 50: C13
chi2/ndf |
chi2/ndf |
0.78 |
|
sigma |
σ |
61.96 |
|
sigma_th |
σ_th |
62.76 |
|
Read. Unif. over Time 150: C13
N |
N |
11678033 |
|
mu |
μ |
11832 |
|
sigma_th |
σ_th |
108.77 |
|
Time unif. distribution 150: C13
chi2/ndf |
chi2/ndf |
3.24 |
|
sigma |
σ |
119.72 |
|
sigma_th |
σ_th |
108.81 |
|
Col. Uniformity Ratio: C13
Col. Uniformity per Event: C13 50
Col. Uniformity per Event: C13 150
S-Curve widths: Noise (e^{-}) C13 100
N |
N |
4159 |
|
mu |
μ |
244.73 |
|
sigma |
σ |
55.14 |
|
threshold |
thr |
2654.37 |
|
fit_peak |
fit peak |
232 |
|
fit_skewness |
ɣ1 |
4.01e-01 |
|
under |
<= |
1.00 |
|