Test Date: 2015-07-07 08:07
Chip 11
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
0/0 |
|
Efficiency |
Efficiency 50/120 |
99.87/99.28 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C11
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.87 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.28 |
|
Efficiency Distr. 150: C11
N |
N |
4160 |
|
mu |
μ |
98.97 |
|
sigma |
σ |
1.75 |
|
Efficiency Distr. 250: C11
N |
N |
4160 |
|
mu |
μ |
97.47 |
|
sigma |
σ |
3.44 |
|
Efficiency Distr. 100: C11
N |
N |
4160 |
|
mu |
μ |
99.61 |
|
sigma |
σ |
0.93 |
|
Efficiency Distr. 50: C11
N |
N |
4160 |
|
mu |
μ |
99.90 |
|
sigma |
σ |
0.47 |
|
Efficiency Distr. 200: C11
N |
N |
4160 |
|
mu |
μ |
97.69 |
|
sigma |
σ |
3.26 |
|
Background Map 150: C11
RealHitrate |
Real Hitrate |
122.06 |
MHz/cm2 |
Background Map 250: C11
RealHitrate |
Real Hitrate |
170.12 |
MHz/cm2 |
Background Map 100: C11
RealHitrate |
Real Hitrate |
84.48 |
MHz/cm2 |
Background Map 50: C11
RealHitrate |
Real Hitrate |
42.18 |
MHz/cm2 |
Background Map 200: C11
RealHitrate |
Real Hitrate |
164.65 |
MHz/cm2 |
Hit Map 50: C11
RealHitrate |
Real Hitrate |
41.48 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 50: C11
Hit Map 150: C11
RealHitrate |
Real Hitrate |
120.69 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 150: C11
Col. Read. Unif. 50: C11
N |
N |
5804232 |
|
mu |
μ |
180315 |
|
sigma |
σ |
424.64 |
|
Col. Read. Unif. 150: C11
N |
N |
16941402 |
|
mu |
μ |
507053 |
|
sigma |
σ |
712.08 |
|
Read. Unif. over Time 50: C11
N |
N |
6709164 |
|
mu |
μ |
6798 |
|
sigma_th |
σ_th |
82.45 |
|
Time unif. distribution 50: C11
chi2/ndf |
chi2/ndf |
0.92 |
|
sigma |
σ |
85.17 |
|
sigma_th |
σ_th |
82.48 |
|
Read. Unif. over Time 150: C11
N |
N |
19524235 |
|
mu |
μ |
19781 |
|
sigma_th |
σ_th |
140.65 |
|
Time unif. distribution 150: C11
chi2/ndf |
chi2/ndf |
2.30 |
|
sigma |
σ |
151.71 |
|
sigma_th |
σ_th |
140.70 |
|
Col. Uniformity Ratio: C11
Col. Uniformity per Event: C11 50
Col. Uniformity per Event: C11 150
S-Curve widths: Noise (e^{-}) C11 100
N |
N |
3874 |
|
mu |
μ |
405.12 |
|
sigma |
σ |
134.61 |
|
threshold |
thr |
3702.12 |
|
fit_peak |
fit peak |
336 |
|
fit_skewness |
ɣ1 |
7.65e-01 |
|
under |
<= |
76.00 |
|
over |
>= |
210.00 |
|