Test Date: 2015-07-07 08:07
Chip 1
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 1/0
Efficiency Efficiency 50/120 99.83/98.93
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C1
InterpolatedEfficiency50 Interpol. Efficiency 50 99.83
InterpolatedEfficiency120 Interpol. Efficiency 120 98.93
Efficiency Distr. 150: C1
N N 4160
mu μ 99.66
sigma σ 0.85
Efficiency Distr. 250: C1
N N 4160
mu μ 99.21
sigma σ 1.34
Efficiency Distr. 100: C1
N N 4160
mu μ 99.85
sigma σ 0.55
Efficiency Distr. 50: C1
N N 4160
mu μ 99.94
sigma σ 0.33
Efficiency Distr. 200: C1
N N 4160
mu μ 99.33
sigma σ 1.23
Background Map 150: C1
RealHitrate Real Hitrate 69.73 MHz/cm2
Background Map 250: C1
RealHitrate Real Hitrate 99.24 MHz/cm2
Background Map 100: C1
RealHitrate Real Hitrate 47.39 MHz/cm2
Background Map 50: C1
RealHitrate Real Hitrate 23.34 MHz/cm2
Background Map 200: C1
RealHitrate Real Hitrate 94.86 MHz/cm2
Hit Map 50: C1
RealHitrate Real Hitrate 22.99 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 50: C1
Hit Map 150: C1
RealHitrate Real Hitrate 68.89 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 150: C1
Col. Read. Unif. 50: C1
N N 3322939
mu μ 80320
sigma σ 283.41
Col. Read. Unif. 150: C1
N N 9956812
mu μ 236670
sigma σ 486.49
Read. Unif. over Time 50: C1
N N 3718463
mu μ 3767
sigma_th σ_th 61.38
Time unif. distribution 50: C1
chi2/ndf chi2/ndf 1.11
sigma σ 62.58
sigma_th σ_th 61.41
Read. Unif. over Time 150: C1
N N 11145235
mu μ 11292
sigma_th σ_th 106.26
Time unif. distribution 150: C1
chi2/ndf chi2/ndf 2.09
sigma σ 114.75
sigma_th σ_th 106.30
Col. Uniformity Ratio: C1
Col. Uniformity per Event: C1 50
Col. Uniformity per Event: C1 150
S-Curve widths: Noise (e^{-}) C1 100
N N 4150
mu μ 316.30
sigma σ 87.42
threshold thr 3099.28
fit_peak fit peak 270
fit_skewness ​ɣ​1 7.73e-01
under <= 4.00
over >= 6.00