Test Date: 2015-07-07 08:07
Chip 0
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 4/1
Efficiency Efficiency 50/120 99.86/99.0
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C0
InterpolatedEfficiency50 Interpol. Efficiency 50 99.86
InterpolatedEfficiency120 Interpol. Efficiency 120 99.00
Efficiency Distr. 150: C0
N N 4160
mu μ 99.70
sigma σ 0.81
Efficiency Distr. 250: C0
N N 4160
mu μ 99.32
sigma σ 1.22
Efficiency Distr. 100: C0
N N 4160
mu μ 99.86
sigma σ 0.55
Efficiency Distr. 50: C0
N N 4160
mu μ 99.94
sigma σ 0.35
Efficiency Distr. 200: C0
N N 4160
mu μ 99.37
sigma σ 1.20
Background Map 150: C0
RealHitrate Real Hitrate 69.36 MHz/cm2
Background Map 250: C0
RealHitrate Real Hitrate 97.93 MHz/cm2
Background Map 100: C0
RealHitrate Real Hitrate 47.86 MHz/cm2
Background Map 50: C0
RealHitrate Real Hitrate 23.59 MHz/cm2
Background Map 200: C0
RealHitrate Real Hitrate 94.56 MHz/cm2
Hit Map 50: C0
RealHitrate Real Hitrate 23.48 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 4
Bump Bonding Defects 50: C0
Hit Map 150: C0
RealHitrate Real Hitrate 69.56 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 150: C0
Col. Read. Unif. 50: C0
N N 3327478
mu μ 76448
sigma σ 276.49
Col. Read. Unif. 150: C0
N N 9886403
mu μ 220779
sigma σ 469.87
Read. Unif. over Time 50: C0
N N 3797214
mu μ 3847
sigma_th σ_th 62.03
Time unif. distribution 50: C0
chi2/ndf chi2/ndf 1.90
sigma σ 65.81
sigma_th σ_th 62.05
Read. Unif. over Time 150: C0
N N 11252324
mu μ 11401
sigma_th σ_th 106.77
Time unif. distribution 150: C0
chi2/ndf chi2/ndf 2.52
sigma σ 116.38
sigma_th σ_th 106.81
Col. Uniformity Ratio: C0
Col. Uniformity per Event: C0 50
Col. Uniformity per Event: C0 150
S-Curve widths: Noise (e^{-}) C0 100
N N 4160
mu μ 161.25
sigma σ 22.94
threshold thr 2141.55
fit_peak fit peak 161
fit_skewness ​ɣ​1 2.34e-02