Test Date: 2015-07-07 08:07
Chip 8
Grading
ROCGrade Final ROC Grade C
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 30/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 1560/0
BumpBondingDefects # Bump Bonding Defects 50/150 0/0
Efficiency Efficiency 50/120 99.89/99.39
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 C/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 C/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C8
InterpolatedEfficiency50 Interpol. Efficiency 50 99.89
InterpolatedEfficiency120 Interpol. Efficiency 120 99.39
Efficiency Distr. 150: C8
N N 4160
mu μ 98.18
sigma σ 2.34
Efficiency Distr. 250: C8
N N 4160
mu μ 94.88
sigma σ 4.82
Efficiency Distr. 100: C8
N N 4160
mu μ 99.37
sigma σ 1.19
Efficiency Distr. 50: C8
N N 4160
mu μ 99.86
sigma σ 0.55
Efficiency Distr. 200: C8
N N 4160
mu μ 95.36
sigma σ 4.51
Background Map 150: C8
RealHitrate Real Hitrate 164.73 MHz/cm2
Background Map 250: C8
RealHitrate Real Hitrate 230.82 MHz/cm2
Background Map 100: C8
RealHitrate Real Hitrate 114.35 MHz/cm2
Background Map 50: C8
RealHitrate Real Hitrate 56.46 MHz/cm2
Background Map 200: C8
RealHitrate Real Hitrate 223.02 MHz/cm2
Hit Map 50: C8
RealHitrate Real Hitrate 59.05 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 50: C8
Hit Map 150: C8
RealHitrate Real Hitrate 161.83 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 150: C8
Col. Read. Unif. 50: C8
N N 8404025
mu μ 182860
sigma σ 427.62
Col. Read. Unif. 150: C8
N N 23067676
mu μ 497029
sigma σ 705.00
Read. Unif. over Time 50: C8
N N 9555618
mu μ 9681
sigma_th σ_th 98.39
Time unif. distribution 50: C8
chi2/ndf chi2/ndf 692.65
sigma σ 2988.94
sigma_th σ_th 98.37
Read. Unif. over Time 150: C8
N N 26169602
mu μ 26541
sigma_th σ_th 162.91
Time unif. distribution 150: C8
chi2/ndf chi2/ndf 6.47
sigma σ 179.83
sigma_th σ_th 162.93
Col. Uniformity Ratio: C8
Col. Uniformity per Event: C8 50
Col. Uniformity per Event: C8 150
S-Curve widths: Noise (e^{-}) C8 100
N N 3958
mu μ 391.00
sigma σ 127.93
threshold thr 3699.72
fit_peak fit peak 326
fit_skewness ​ɣ​1 7.65e-01
under <= 59.00
over >= 143.00