Test Date: 2015-07-07 08:07
Chip 4
Grading
ROCGrade Final ROC Grade C
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 30/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 1560/0
BumpBondingDefects # Bump Bonding Defects 50/150 0/0
Efficiency Efficiency 50/120 99.88/99.28
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 C/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 C/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C4
InterpolatedEfficiency50 Interpol. Efficiency 50 99.88
InterpolatedEfficiency120 Interpol. Efficiency 120 99.28
Efficiency Distr. 150: C4
N N 4160
mu μ 97.79
sigma σ 3.23
Efficiency Distr. 250: C4
N N 4160
mu μ 94.34
sigma σ 6.19
Efficiency Distr. 100: C4
N N 4160
mu μ 99.24
sigma σ 1.51
Efficiency Distr. 50: C4
N N 4160
mu μ 99.83
sigma σ 0.64
Efficiency Distr. 200: C4
N N 4160
mu μ 94.77
sigma σ 5.96
Background Map 150: C4
RealHitrate Real Hitrate 161.99 MHz/cm2
Background Map 250: C4
RealHitrate Real Hitrate 223.11 MHz/cm2
Background Map 100: C4
RealHitrate Real Hitrate 112.65 MHz/cm2
Background Map 50: C4
RealHitrate Real Hitrate 56.76 MHz/cm2
Background Map 200: C4
RealHitrate Real Hitrate 217.40 MHz/cm2
Hit Map 50: C4
RealHitrate Real Hitrate 59.50 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 50: C4
Hit Map 150: C4
RealHitrate Real Hitrate 161.25 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 150: C4
Col. Read. Unif. 50: C4
N N 8361908
mu μ 196378
sigma σ 443.15
Col. Read. Unif. 150: C4
N N 22700725
mu μ 532277
sigma σ 729.57
Read. Unif. over Time 50: C4
N N 9628463
mu μ 9755
sigma_th σ_th 98.77
Time unif. distribution 50: C4
chi2/ndf chi2/ndf 307.92
sigma σ 2917.94
sigma_th σ_th 98.75
Read. Unif. over Time 150: C4
N N 26074972
mu μ 26445
sigma_th σ_th 162.62
Time unif. distribution 150: C4
chi2/ndf chi2/ndf 7.77
sigma σ 186.92
sigma_th σ_th 162.63
Col. Uniformity Ratio: C4
Col. Uniformity per Event: C4 50
Col. Uniformity per Event: C4 150
S-Curve widths: Noise (e^{-}) C4 100
N N 3677
mu μ 423.14
sigma σ 153.90
threshold thr 3919.45
fit_peak fit peak 332
fit_skewness ​ɣ​1 8.57e-01
under <= 123.00
over >= 360.00