Test Date: 2015-07-07 08:07
Chip 15
Grading
ROCGrade |
Final ROC Grade |
C |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
30/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
1558/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
2/2 |
|
Efficiency |
Efficiency 50/120 |
99.84/99.26 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
C/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
C/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C15
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.84 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.26 |
|
Efficiency Distr. 150: C15
N |
N |
4160 |
|
mu |
μ |
99.43 |
|
sigma |
σ |
1.15 |
|
Efficiency Distr. 250: C15
N |
N |
4160 |
|
mu |
μ |
98.79 |
|
sigma |
σ |
1.88 |
|
Efficiency Distr. 100: C15
N |
N |
4160 |
|
mu |
μ |
99.76 |
|
sigma |
σ |
0.71 |
|
Efficiency Distr. 50: C15
N |
N |
4160 |
|
mu |
μ |
99.93 |
|
sigma |
σ |
0.39 |
|
Efficiency Distr. 200: C15
N |
N |
4160 |
|
mu |
μ |
98.87 |
|
sigma |
σ |
1.77 |
|
Background Map 150: C15
RealHitrate |
Real Hitrate |
94.93 |
MHz/cm2 |
Background Map 250: C15
RealHitrate |
Real Hitrate |
132.11 |
MHz/cm2 |
Background Map 100: C15
RealHitrate |
Real Hitrate |
65.47 |
MHz/cm2 |
Background Map 50: C15
RealHitrate |
Real Hitrate |
32.73 |
MHz/cm2 |
Background Map 200: C15
RealHitrate |
Real Hitrate |
127.36 |
MHz/cm2 |
Hit Map 50: C15
RealHitrate |
Real Hitrate |
34.59 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
2 |
|
Bump Bonding Defects 50: C15
Hit Map 150: C15
RealHitrate |
Real Hitrate |
93.95 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
2 |
|
Bump Bonding Defects 150: C15
Col. Read. Unif. 50: C15
N |
N |
4876927 |
|
mu |
μ |
118942 |
|
sigma |
σ |
344.88 |
|
Col. Read. Unif. 150: C15
N |
N |
13277068 |
|
mu |
μ |
321562 |
|
sigma |
σ |
567.06 |
|
Read. Unif. over Time 50: C15
N |
N |
5597651 |
|
mu |
μ |
5671 |
|
sigma_th |
σ_th |
75.31 |
|
Time unif. distribution 50: C15
chi2/ndf |
chi2/ndf |
1143.94 |
|
sigma |
σ |
1755.51 |
|
sigma_th |
σ_th |
75.29 |
|
Read. Unif. over Time 150: C15
N |
N |
15192745 |
|
mu |
μ |
15408 |
|
sigma_th |
σ_th |
124.13 |
|
Time unif. distribution 150: C15
chi2/ndf |
chi2/ndf |
14.51 |
|
sigma |
σ |
150.90 |
|
sigma_th |
σ_th |
124.14 |
|
Col. Uniformity Ratio: C15
Col. Uniformity per Event: C15 50
Col. Uniformity per Event: C15 150
S-Curve widths: Noise (e^{-}) C15 100
N |
N |
3934 |
|
mu |
μ |
392.33 |
|
sigma |
σ |
126.65 |
|
threshold |
thr |
3637.14 |
|
fit_peak |
fit peak |
326 |
|
fit_skewness |
ɣ1 |
7.68e-01 |
|
under |
<= |
62.00 |
|
over |
>= |
164.00 |
|