Test Date: 2015-07-07 08:07
Chip 14
Grading
ROCGrade |
Final ROC Grade |
C |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
30/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
1558/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
3/3 |
|
Efficiency |
Efficiency 50/120 |
99.84/99.26 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
C/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
C/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C14
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.84 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.26 |
|
Efficiency Distr. 150: C14
N |
N |
4160 |
|
mu |
μ |
99.47 |
|
sigma |
σ |
1.07 |
|
Efficiency Distr. 250: C14
N |
N |
4160 |
|
mu |
μ |
98.74 |
|
sigma |
σ |
1.83 |
|
Efficiency Distr. 100: C14
N |
N |
4160 |
|
mu |
μ |
99.76 |
|
sigma |
σ |
0.74 |
|
Efficiency Distr. 50: C14
N |
N |
4160 |
|
mu |
μ |
99.92 |
|
sigma |
σ |
0.40 |
|
Efficiency Distr. 200: C14
N |
N |
4160 |
|
mu |
μ |
98.82 |
|
sigma |
σ |
1.71 |
|
Background Map 150: C14
RealHitrate |
Real Hitrate |
97.05 |
MHz/cm2 |
Background Map 250: C14
RealHitrate |
Real Hitrate |
137.20 |
MHz/cm2 |
Background Map 100: C14
RealHitrate |
Real Hitrate |
67.06 |
MHz/cm2 |
Background Map 50: C14
RealHitrate |
Real Hitrate |
33.17 |
MHz/cm2 |
Background Map 200: C14
RealHitrate |
Real Hitrate |
132.32 |
MHz/cm2 |
Hit Map 50: C14
RealHitrate |
Real Hitrate |
34.93 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
3 |
|
Bump Bonding Defects 50: C14
Hit Map 150: C14
RealHitrate |
Real Hitrate |
96.31 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
5 |
|
Bump Bonding Defects 150: C14
Col. Read. Unif. 50: C14
N |
N |
5040092 |
|
mu |
μ |
85508 |
|
sigma |
σ |
292.42 |
|
Col. Read. Unif. 150: C14
N |
N |
13882978 |
|
mu |
μ |
245524 |
|
sigma |
σ |
495.50 |
|
Read. Unif. over Time 50: C14
N |
N |
5652532 |
|
mu |
μ |
5727 |
|
sigma_th |
σ_th |
75.68 |
|
Time unif. distribution 50: C14
chi2/ndf |
chi2/ndf |
2124.22 |
|
sigma |
σ |
1800.85 |
|
sigma_th |
σ_th |
75.66 |
|
Read. Unif. over Time 150: C14
N |
N |
15574585 |
|
mu |
μ |
15796 |
|
sigma_th |
σ_th |
125.68 |
|
Time unif. distribution 150: C14
chi2/ndf |
chi2/ndf |
7.26 |
|
sigma |
σ |
144.59 |
|
sigma_th |
σ_th |
125.69 |
|
Col. Uniformity Ratio: C14
Col. Uniformity per Event: C14 50
Col. Uniformity per Event: C14 150
S-Curve widths: Noise (e^{-}) C14 100
N |
N |
4096 |
|
mu |
μ |
385.38 |
|
sigma |
σ |
114.89 |
|
threshold |
thr |
3156.81 |
|
fit_peak |
fit peak |
323 |
|
fit_skewness |
ɣ1 |
7.73e-01 |
|
under |
<= |
11.00 |
|
over |
>= |
53.00 |
|