Test Date: 2015-07-07 08:07
Chip 11
Grading
ROCGrade |
Final ROC Grade |
C |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
30/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
1560/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
1/1 |
|
Efficiency |
Efficiency 50/120 |
99.89/99.33 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
C/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
C/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C11
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.89 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.33 |
|
Efficiency Distr. 150: C11
N |
N |
4160 |
|
mu |
μ |
97.97 |
|
sigma |
σ |
2.88 |
|
Efficiency Distr. 250: C11
N |
N |
4160 |
|
mu |
μ |
94.71 |
|
sigma |
σ |
5.91 |
|
Efficiency Distr. 100: C11
N |
N |
4160 |
|
mu |
μ |
99.27 |
|
sigma |
σ |
1.42 |
|
Efficiency Distr. 50: C11
N |
N |
4160 |
|
mu |
μ |
99.85 |
|
sigma |
σ |
0.54 |
|
Efficiency Distr. 200: C11
N |
N |
4160 |
|
mu |
μ |
95.14 |
|
sigma |
σ |
5.73 |
|
Background Map 150: C11
RealHitrate |
Real Hitrate |
160.28 |
MHz/cm2 |
Background Map 250: C11
RealHitrate |
Real Hitrate |
221.72 |
MHz/cm2 |
Background Map 100: C11
RealHitrate |
Real Hitrate |
111.84 |
MHz/cm2 |
Background Map 50: C11
RealHitrate |
Real Hitrate |
56.26 |
MHz/cm2 |
Background Map 200: C11
RealHitrate |
Real Hitrate |
215.26 |
MHz/cm2 |
Hit Map 50: C11
RealHitrate |
Real Hitrate |
58.89 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
1 |
|
Bump Bonding Defects 50: C11
Hit Map 150: C11
RealHitrate |
Real Hitrate |
161.50 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
1 |
|
Bump Bonding Defects 150: C11
Col. Read. Unif. 50: C11
N |
N |
8277128 |
|
mu |
μ |
248359 |
|
sigma |
σ |
498.36 |
|
Col. Read. Unif. 150: C11
N |
N |
22742576 |
|
mu |
μ |
659980 |
|
sigma |
σ |
812.39 |
|
Read. Unif. over Time 50: C11
N |
N |
9528492 |
|
mu |
μ |
9654 |
|
sigma_th |
σ_th |
98.25 |
|
Time unif. distribution 50: C11
chi2/ndf |
chi2/ndf |
286.15 |
|
sigma |
σ |
2887.73 |
|
sigma_th |
σ_th |
98.24 |
|
Read. Unif. over Time 150: C11
N |
N |
26115050 |
|
mu |
μ |
26486 |
|
sigma_th |
σ_th |
162.74 |
|
Time unif. distribution 150: C11
chi2/ndf |
chi2/ndf |
11.16 |
|
sigma |
σ |
187.78 |
|
sigma_th |
σ_th |
162.75 |
|
Col. Uniformity Ratio: C11
Col. Uniformity per Event: C11 50
Col. Uniformity per Event: C11 150
S-Curve widths: Noise (e^{-}) C11 100
N |
N |
4056 |
|
mu |
μ |
392.89 |
|
sigma |
σ |
114.62 |
|
threshold |
thr |
3449.38 |
|
fit_peak |
fit peak |
343 |
|
fit_skewness |
ɣ1 |
6.66e-01 |
|
under |
<= |
32.00 |
|
over |
>= |
72.00 |
|