Test Date: 2015-07-07 08:07
Chip 10
Grading
ROCGrade |
Final ROC Grade |
C |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
30/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
1560/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
0/0 |
|
Efficiency |
Efficiency 50/120 |
99.88/99.35 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
C/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
C/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C10
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.88 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.35 |
|
Efficiency Distr. 150: C10
N |
N |
4160 |
|
mu |
μ |
96.47 |
|
sigma |
σ |
4.00 |
|
Efficiency Distr. 250: C10
N |
N |
4160 |
|
mu |
μ |
90.90 |
|
sigma |
σ |
7.83 |
|
Efficiency Distr. 100: C10
N |
N |
4160 |
|
mu |
μ |
98.80 |
|
sigma |
σ |
1.88 |
|
Efficiency Distr. 50: C10
N |
N |
4160 |
|
mu |
μ |
99.78 |
|
sigma |
σ |
0.67 |
|
Efficiency Distr. 200: C10
N |
N |
4160 |
|
mu |
μ |
91.59 |
|
sigma |
σ |
7.53 |
|
Background Map 150: C10
RealHitrate |
Real Hitrate |
193.88 |
MHz/cm2 |
Background Map 250: C10
RealHitrate |
Real Hitrate |
266.30 |
MHz/cm2 |
Background Map 100: C10
RealHitrate |
Real Hitrate |
135.83 |
MHz/cm2 |
Background Map 50: C10
RealHitrate |
Real Hitrate |
68.86 |
MHz/cm2 |
Background Map 200: C10
RealHitrate |
Real Hitrate |
259.35 |
MHz/cm2 |
Hit Map 50: C10
RealHitrate |
Real Hitrate |
71.96 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 50: C10
Hit Map 150: C10
RealHitrate |
Real Hitrate |
192.33 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 150: C10
Col. Read. Unif. 50: C10
N |
N |
10151907 |
|
mu |
μ |
263122 |
|
sigma |
σ |
512.95 |
|
Col. Read. Unif. 150: C10
N |
N |
27184613 |
|
mu |
μ |
693534 |
|
sigma |
σ |
832.79 |
|
Read. Unif. over Time 50: C10
N |
N |
11644102 |
|
mu |
μ |
11797 |
|
sigma_th |
σ_th |
108.62 |
|
Time unif. distribution 50: C10
chi2/ndf |
chi2/ndf |
332.68 |
|
sigma |
σ |
3468.22 |
|
sigma_th |
σ_th |
108.60 |
|
Read. Unif. over Time 150: C10
N |
N |
31101349 |
|
mu |
μ |
31543 |
|
sigma_th |
σ_th |
177.60 |
|
Time unif. distribution 150: C10
chi2/ndf |
chi2/ndf |
12.98 |
|
sigma |
σ |
202.82 |
|
sigma_th |
σ_th |
177.62 |
|
Col. Uniformity Ratio: C10
Col. Uniformity per Event: C10 50
Col. Uniformity per Event: C10 150
S-Curve widths: Noise (e^{-}) C10 100
N |
N |
3701 |
|
mu |
μ |
424.16 |
|
sigma |
σ |
151.68 |
|
threshold |
thr |
3749.07 |
|
fit_peak |
fit peak |
341 |
|
fit_skewness |
ɣ1 |
8.05e-01 |
|
under |
<= |
128.00 |
|
over |
>= |
331.00 |
|