Test Date: 2015-07-07 08:07
Chip 1
Grading
ROCGrade Final ROC Grade C
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 30/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 1558/0
BumpBondingDefects # Bump Bonding Defects 50/150 0/0
Efficiency Efficiency 50/120 99.85/99.19
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 C/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 C/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C1
InterpolatedEfficiency50 Interpol. Efficiency 50 99.85
InterpolatedEfficiency120 Interpol. Efficiency 120 99.19
Efficiency Distr. 150: C1
N N 4160
mu μ 99.44
sigma σ 1.10
Efficiency Distr. 250: C1
N N 4160
mu μ 98.60
sigma σ 1.87
Efficiency Distr. 100: C1
N N 4160
mu μ 99.77
sigma σ 0.70
Efficiency Distr. 50: C1
N N 4160
mu μ 99.92
sigma σ 0.41
Efficiency Distr. 200: C1
N N 4160
mu μ 98.76
sigma σ 1.80
Background Map 150: C1
RealHitrate Real Hitrate 96.77 MHz/cm2
Background Map 250: C1
RealHitrate Real Hitrate 135.45 MHz/cm2
Background Map 100: C1
RealHitrate Real Hitrate 66.63 MHz/cm2
Background Map 50: C1
RealHitrate Real Hitrate 32.79 MHz/cm2
Background Map 200: C1
RealHitrate Real Hitrate 131.30 MHz/cm2
Hit Map 50: C1
RealHitrate Real Hitrate 34.69 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 50: C1
Hit Map 150: C1
RealHitrate Real Hitrate 95.15 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 2
Bump Bonding Defects 150: C1
Col. Read. Unif. 50: C1
N N 5015039
mu μ 118233
sigma σ 343.85
Col. Read. Unif. 150: C1
N N 13740555
mu μ 319330
sigma σ 565.09
Read. Unif. over Time 50: C1
N N 5613268
mu μ 5687
sigma_th σ_th 75.41
Time unif. distribution 50: C1
chi2/ndf chi2/ndf 2645.82
sigma σ 1783.11
sigma_th σ_th 75.40
Read. Unif. over Time 150: C1
N N 15385779
mu μ 15604
sigma_th σ_th 124.92
Time unif. distribution 150: C1
chi2/ndf chi2/ndf 19.86
sigma σ 160.20
sigma_th σ_th 124.93
Col. Uniformity Ratio: C1
Col. Uniformity per Event: C1 50
Col. Uniformity per Event: C1 150
S-Curve widths: Noise (e^{-}) C1 100
N N 4146
mu μ 343.34
sigma σ 87.61
threshold thr 3191.61
fit_peak fit peak 308
fit_skewness ​ɣ​1 6.27e-01
under <= 6.00
over >= 8.00