Test Date: 2015-07-07 08:07
Chip 0
Grading
ROCGrade Final ROC Grade C
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 30/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 1557/0
BumpBondingDefects # Bump Bonding Defects 50/150 1/1
Efficiency Efficiency 50/120 99.83/99.28
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 C/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 C/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C0
InterpolatedEfficiency50 Interpol. Efficiency 50 99.83
InterpolatedEfficiency120 Interpol. Efficiency 120 99.28
Efficiency Distr. 150: C0
N N 4160
mu μ 99.43
sigma σ 1.90
Efficiency Distr. 250: C0
N N 4160
mu μ 98.77
sigma σ 2.34
Efficiency Distr. 100: C0
N N 4160
mu μ 99.73
sigma σ 1.70
Efficiency Distr. 50: C0
N N 4160
mu μ 99.90
sigma σ 1.60
Efficiency Distr. 200: C0
N N 4160
mu μ 98.88
sigma σ 2.24
Background Map 150: C0
RealHitrate Real Hitrate 97.28 MHz/cm2
Background Map 250: C0
RealHitrate Real Hitrate 134.82 MHz/cm2
Background Map 100: C0
RealHitrate Real Hitrate 67.39 MHz/cm2
Background Map 50: C0
RealHitrate Real Hitrate 33.53 MHz/cm2
Background Map 200: C0
RealHitrate Real Hitrate 131.23 MHz/cm2
Hit Map 50: C0
RealHitrate Real Hitrate 35.53 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 2
Bump Bonding Defects 50: C0
Hit Map 150: C0
RealHitrate Real Hitrate 95.84 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 3
Bump Bonding Defects 150: C0
Col. Read. Unif. 50: C0
N N 5042777
mu μ 114802
sigma σ 338.82
Col. Read. Unif. 150: C0
N N 13630909
mu μ 300200
sigma σ 547.91
Read. Unif. over Time 50: C0
N N 5748643
mu μ 5824
sigma_th σ_th 76.32
Time unif. distribution 50: C0
chi2/ndf chi2/ndf 1689.15
sigma σ 1778.78
sigma_th σ_th 76.30
Read. Unif. over Time 150: C0
N N 15497872
mu μ 15718
sigma_th σ_th 125.37
Time unif. distribution 150: C0
chi2/ndf chi2/ndf 11.37
sigma σ 150.53
sigma_th σ_th 125.38
Col. Uniformity Ratio: C0
Col. Uniformity per Event: C0 50
Col. Uniformity per Event: C0 150
S-Curve widths: Noise (e^{-}) C0 100
N N 4150
mu μ 295.35
sigma σ 69.98
threshold thr 2961.86
fit_peak fit peak 270
fit_skewness ​ɣ​1 5.84e-01
under <= 8.00
over >= 2.00