Test Date: 2015-07-07 08:07
Chip 8
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 1/1
Efficiency Efficiency 50/120 99.87/99.35
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C8
InterpolatedEfficiency50 Interpol. Efficiency 50 99.87
InterpolatedEfficiency120 Interpol. Efficiency 120 99.35
Efficiency Distr. 150: C8
N N 4160
mu μ 98.76
sigma σ 1.77
Efficiency Distr. 250: C8
N N 4160
mu μ 96.85
sigma σ 3.39
Efficiency Distr. 100: C8
N N 4160
mu μ 99.54
sigma σ 0.99
Efficiency Distr. 50: C8
N N 4160
mu μ 99.87
sigma σ 0.52
Efficiency Distr. 200: C8
N N 4160
mu μ 97.19
sigma σ 3.21
Background Map 150: C8
RealHitrate Real Hitrate 139.91 MHz/cm2
Background Map 250: C8
RealHitrate Real Hitrate 194.92 MHz/cm2
Background Map 100: C8
RealHitrate Real Hitrate 96.80 MHz/cm2
Background Map 50: C8
RealHitrate Real Hitrate 48.69 MHz/cm2
Background Map 200: C8
RealHitrate Real Hitrate 187.99 MHz/cm2
Hit Map 50: C8
RealHitrate Real Hitrate 48.13 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 50: C8
Hit Map 150: C8
RealHitrate Real Hitrate 139.66 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 150: C8
Col. Read. Unif. 50: C8
N N 6841914
mu μ 149858
sigma σ 387.11
Col. Read. Unif. 150: C8
N N 19896290
mu μ 433323
sigma σ 658.27
Read. Unif. over Time 50: C8
N N 7787136
mu μ 7890
sigma_th σ_th 88.82
Time unif. distribution 50: C8
chi2/ndf chi2/ndf 0.97
sigma σ 93.67
sigma_th σ_th 88.85
Read. Unif. over Time 150: C8
N N 22592024
mu μ 22890
sigma_th σ_th 151.29
Time unif. distribution 150: C8
chi2/ndf chi2/ndf 4.79
sigma σ 166.23
sigma_th σ_th 151.36
Col. Uniformity Ratio: C8
Col. Uniformity per Event: C8 50
Col. Uniformity per Event: C8 150
S-Curve widths: Noise (e^{-}) C8 100
N N 3935
mu μ 373.85
sigma σ 126.64
threshold thr 3699.30
fit_peak fit peak 308
fit_skewness ​ɣ​1 7.76e-01
under <= 72.00
over >= 153.00