Test Date: 2015-07-07 08:07
Chip 7
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 9/9
Efficiency Efficiency 50/120 99.89/99.31
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C7
InterpolatedEfficiency50 Interpol. Efficiency 50 99.89
InterpolatedEfficiency120 Interpol. Efficiency 120 99.31
Efficiency Distr. 150: C7
N N 4160
mu μ 98.35
sigma σ 2.22
Efficiency Distr. 250: C7
N N 4160
mu μ 95.53
sigma σ 4.44
Efficiency Distr. 100: C7
N N 4160
mu μ 99.41
sigma σ 1.14
Efficiency Distr. 50: C7
N N 4160
mu μ 99.87
sigma σ 0.52
Efficiency Distr. 200: C7
N N 4160
mu μ 95.91
sigma σ 3.97
Background Map 150: C7
RealHitrate Real Hitrate 152.82 MHz/cm2
Background Map 250: C7
RealHitrate Real Hitrate 213.75 MHz/cm2
Background Map 100: C7
RealHitrate Real Hitrate 106.81 MHz/cm2
Background Map 50: C7
RealHitrate Real Hitrate 53.19 MHz/cm2
Background Map 200: C7
RealHitrate Real Hitrate 206.82 MHz/cm2
Hit Map 50: C7
RealHitrate Real Hitrate 52.49 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 9
Bump Bonding Defects 50: C7
Hit Map 150: C7
RealHitrate Real Hitrate 151.97 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 9
Bump Bonding Defects 150: C7
Col. Read. Unif. 50: C7
N N 7492966
mu μ 181607
sigma σ 426.15
Col. Read. Unif. 150: C7
N N 21733068
mu μ 520151
sigma σ 721.21
Read. Unif. over Time 50: C7
N N 8492443
mu μ 8604
sigma_th σ_th 92.76
Time unif. distribution 50: C7
chi2/ndf chi2/ndf 1.35
sigma σ 97.42
sigma_th σ_th 92.78
Read. Unif. over Time 150: C7
N N 24583368
mu μ 24907
sigma_th σ_th 157.82
Time unif. distribution 150: C7
chi2/ndf chi2/ndf 7.66
sigma σ 179.54
sigma_th σ_th 157.88
Col. Uniformity Ratio: C7
Col. Uniformity per Event: C7 50
Col. Uniformity per Event: C7 150
S-Curve widths: Noise (e^{-}) C7 100
N N 3801
mu μ 409.20
sigma σ 139.36
threshold thr 3795.74
fit_peak fit peak 326
fit_skewness ​ɣ​1 8.40e-01
under <= 92.00
over >= 267.00