Test Date: 2015-07-07 08:07
Chip 6
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 10/10
Efficiency Efficiency 50/120 99.87/99.31
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C6
InterpolatedEfficiency50 Interpol. Efficiency 50 99.87
InterpolatedEfficiency120 Interpol. Efficiency 120 99.31
Efficiency Distr. 150: C6
N N 4160
mu μ 98.11
sigma σ 2.68
Efficiency Distr. 250: C6
N N 4160
mu μ 94.98
sigma σ 5.66
Efficiency Distr. 100: C6
N N 4160
mu μ 99.32
sigma σ 1.31
Efficiency Distr. 50: C6
N N 4160
mu μ 99.85
sigma σ 0.57
Efficiency Distr. 200: C6
N N 4160
mu μ 95.47
sigma σ 5.36
Background Map 150: C6
RealHitrate Real Hitrate 152.18 MHz/cm2
Background Map 250: C6
RealHitrate Real Hitrate 211.13 MHz/cm2
Background Map 100: C6
RealHitrate Real Hitrate 106.28 MHz/cm2
Background Map 50: C6
RealHitrate Real Hitrate 53.37 MHz/cm2
Background Map 200: C6
RealHitrate Real Hitrate 205.18 MHz/cm2
Hit Map 50: C6
RealHitrate Real Hitrate 52.71 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 10
Bump Bonding Defects 50: C6
Hit Map 150: C6
RealHitrate Real Hitrate 151.26 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 10
Bump Bonding Defects 150: C6
Col. Read. Unif. 50: C6
N N 7364073
mu μ 207160
sigma σ 455.15
Col. Read. Unif. 150: C6
N N 21201311
mu μ 579581
sigma σ 761.30
Read. Unif. over Time 50: C6
N N 8528271
mu μ 8641
sigma_th σ_th 92.95
Time unif. distribution 50: C6
chi2/ndf chi2/ndf 2.45
sigma σ 99.17
sigma_th σ_th 92.98
Read. Unif. over Time 150: C6
N N 24467324
mu μ 24790
sigma_th σ_th 157.45
Time unif. distribution 150: C6
chi2/ndf chi2/ndf 10.13
sigma σ 183.41
sigma_th σ_th 157.51
Col. Uniformity Ratio: C6
Col. Uniformity per Event: C6 50
Col. Uniformity per Event: C6 150
S-Curve widths: Noise (e^{-}) C6 100
N N 4082
mu μ 372.50
sigma σ 107.99
threshold thr 3540.92
fit_peak fit peak 330
fit_skewness ​ɣ​1 6.18e-01
under <= 30.00
over >= 48.00