Test Date: 2015-07-07 08:07
Chip 4
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 1/0
Efficiency Efficiency 50/120 99.89/99.36
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C4
InterpolatedEfficiency50 Interpol. Efficiency 50 99.89
InterpolatedEfficiency120 Interpol. Efficiency 120 99.36
Efficiency Distr. 150: C4
N N 4160
mu μ 98.76
sigma σ 2.01
Efficiency Distr. 250: C4
N N 4160
mu μ 96.72
sigma σ 4.06
Efficiency Distr. 100: C4
N N 4160
mu μ 99.54
sigma σ 1.06
Efficiency Distr. 50: C4
N N 4160
mu μ 99.89
sigma σ 0.47
Efficiency Distr. 200: C4
N N 4160
mu μ 97.04
sigma σ 3.80
Background Map 150: C4
RealHitrate Real Hitrate 136.90 MHz/cm2
Background Map 250: C4
RealHitrate Real Hitrate 189.35 MHz/cm2
Background Map 100: C4
RealHitrate Real Hitrate 95.16 MHz/cm2
Background Map 50: C4
RealHitrate Real Hitrate 47.96 MHz/cm2
Background Map 200: C4
RealHitrate Real Hitrate 184.60 MHz/cm2
Hit Map 50: C4
RealHitrate Real Hitrate 47.71 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 50: C4
Hit Map 150: C4
RealHitrate Real Hitrate 137.01 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 150: C4
Col. Read. Unif. 50: C4
N N 6711763
mu μ 144635
sigma σ 380.31
Col. Read. Unif. 150: C4
N N 19317261
mu μ 420818
sigma σ 648.70
Read. Unif. over Time 50: C4
N N 7719806
mu μ 7821
sigma_th σ_th 88.44
Time unif. distribution 50: C4
chi2/ndf chi2/ndf 1.09
sigma σ 91.05
sigma_th σ_th 88.46
Read. Unif. over Time 150: C4
N N 22162647
mu μ 22455
sigma_th σ_th 149.85
Time unif. distribution 150: C4
chi2/ndf chi2/ndf 4.09
sigma σ 166.66
sigma_th σ_th 149.91
Col. Uniformity Ratio: C4
Col. Uniformity per Event: C4 50
Col. Uniformity per Event: C4 150
S-Curve widths: Noise (e^{-}) C4 100
N N 3653
mu μ 421.80
sigma σ 161.80
threshold thr 3966.48
fit_peak fit peak 312
fit_skewness ​ɣ​1 8.91e-01
under <= 136.00
over >= 371.00