Test Date: 2015-07-07 08:07
Chip 2
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 1/0
Efficiency Efficiency 50/120 99.86/99.3
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C2
InterpolatedEfficiency50 Interpol. Efficiency 50 99.86
InterpolatedEfficiency120 Interpol. Efficiency 120 99.30
Efficiency Distr. 150: C2
N N 4160
mu μ 99.50
sigma σ 1.36
Efficiency Distr. 250: C2
N N 4160
mu μ 98.83
sigma σ 2.79
Efficiency Distr. 100: C2
N N 4160
mu μ 99.79
sigma σ 0.73
Efficiency Distr. 50: C2
N N 4160
mu μ 99.95
sigma σ 0.33
Efficiency Distr. 200: C2
N N 4160
mu μ 98.92
sigma σ 2.62
Background Map 150: C2
RealHitrate Real Hitrate 76.32 MHz/cm2
Background Map 250: C2
RealHitrate Real Hitrate 108.28 MHz/cm2
Background Map 100: C2
RealHitrate Real Hitrate 52.73 MHz/cm2
Background Map 50: C2
RealHitrate Real Hitrate 25.80 MHz/cm2
Background Map 200: C2
RealHitrate Real Hitrate 104.17 MHz/cm2
Hit Map 50: C2
RealHitrate Real Hitrate 25.53 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
Bump Bonding Defects 50: C2
Hit Map 150: C2
RealHitrate Real Hitrate 76.35 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 150: C2
Col. Read. Unif. 50: C2
N N 3428215
mu μ 60105
sigma σ 245.16
Col. Read. Unif. 150: C2
N N 10330795
mu μ 188271
sigma σ 433.90
Read. Unif. over Time 50: C2
N N 4131255
mu μ 4186
sigma_th σ_th 64.70
Time unif. distribution 50: C2
chi2/ndf chi2/ndf 1.17
sigma σ 67.19
sigma_th σ_th 64.71
Read. Unif. over Time 150: C2
N N 12350228
mu μ 12513
sigma_th σ_th 111.86
Time unif. distribution 150: C2
chi2/ndf chi2/ndf 1.47
sigma σ 115.29
sigma_th σ_th 111.91
Col. Uniformity Ratio: C2
Col. Uniformity per Event: C2 50
Col. Uniformity per Event: C2 150
S-Curve widths: Noise (e^{-}) C2 100
N N 4157
mu μ 287.15
sigma σ 67.81
threshold thr 2868.13
fit_peak fit peak 260
fit_skewness ​ɣ​1 6.44e-01
under <= 2.00
over >= 1.00