Test Date: 2015-07-07 08:07
Chip 14
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
0/0 |
|
Efficiency |
Efficiency 50/120 |
99.85/99.01 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C14
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.85 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.01 |
|
Efficiency Distr. 150: C14
N |
N |
4160 |
|
mu |
μ |
99.76 |
|
sigma |
σ |
0.70 |
|
Efficiency Distr. 250: C14
N |
N |
4160 |
|
mu |
μ |
99.48 |
|
sigma |
σ |
1.06 |
|
Efficiency Distr. 100: C14
N |
N |
4160 |
|
mu |
μ |
99.87 |
|
sigma |
σ |
0.50 |
|
Efficiency Distr. 50: C14
N |
N |
4160 |
|
mu |
μ |
99.96 |
|
sigma |
σ |
0.28 |
|
Efficiency Distr. 200: C14
N |
N |
4160 |
|
mu |
μ |
99.51 |
|
sigma |
σ |
1.02 |
|
Background Map 150: C14
RealHitrate |
Real Hitrate |
62.79 |
MHz/cm2 |
Background Map 250: C14
RealHitrate |
Real Hitrate |
89.79 |
MHz/cm2 |
Background Map 100: C14
RealHitrate |
Real Hitrate |
42.87 |
MHz/cm2 |
Background Map 50: C14
RealHitrate |
Real Hitrate |
20.89 |
MHz/cm2 |
Background Map 200: C14
RealHitrate |
Real Hitrate |
85.99 |
MHz/cm2 |
Hit Map 50: C14
RealHitrate |
Real Hitrate |
20.36 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 50: C14
Hit Map 150: C14
RealHitrate |
Real Hitrate |
61.95 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 150: C14
Col. Read. Unif. 50: C14
N |
N |
2937187 |
|
mu |
μ |
51018 |
|
sigma |
σ |
225.87 |
|
Col. Read. Unif. 150: C14
N |
N |
8932460 |
|
mu |
μ |
160195 |
|
sigma |
σ |
400.24 |
|
Read. Unif. over Time 50: C14
N |
N |
3294477 |
|
mu |
μ |
3338 |
|
sigma_th |
σ_th |
57.77 |
|
Time unif. distribution 50: C14
chi2/ndf |
chi2/ndf |
0.92 |
|
sigma |
σ |
60.17 |
|
sigma_th |
σ_th |
57.79 |
|
Read. Unif. over Time 150: C14
N |
N |
10021693 |
|
mu |
μ |
10154 |
|
sigma_th |
σ_th |
100.77 |
|
Time unif. distribution 150: C14
chi2/ndf |
chi2/ndf |
4.89 |
|
sigma |
σ |
111.93 |
|
sigma_th |
σ_th |
100.81 |
|
Col. Uniformity Ratio: C14
Col. Uniformity per Event: C14 50
Col. Uniformity per Event: C14 150
S-Curve widths: Noise (e^{-}) C14 100
N |
N |
4160 |
|
mu |
μ |
143.19 |
|
sigma |
σ |
20.80 |
|
threshold |
thr |
2009.22 |
|
fit_peak |
fit peak |
143 |
|
fit_skewness |
ɣ1 |
6.85e-08 |
|