Test Date: 2015-07-07 08:07
Chip 11
Grading
ROCGrade |
Final ROC Grade |
A |
|
NumberOfHotPixels |
# Hot Pixels 50/150 |
0/0 |
|
NumberOfNonUniformColumns |
# Non-Uniform Columns 50/150 |
0 |
|
NumberOfNonUniformEvents |
# Non-Uniform ROC Events 50/150 |
0/0 |
|
NumberOfNonUniformColumnEvents |
# Non-Uniform Col. Events 50/150 |
0/0 |
|
BumpBondingDefects |
# Bump Bonding Defects 50/150 |
1/0 |
|
Efficiency |
Efficiency 50/120 |
99.87/99.35 |
|
EfficiencyGrade |
Efficiency Grade 50/120 |
(A)/A |
|
HotPixelsGrade |
Hot Pixels Grade 50/150 |
(A)/(A) |
|
HitMapGrade |
Hit Map Grade 50/150 |
(A)/A |
|
ReadoutUniformityOverTimeGrade |
ROC Read. Unif. Grade 50/150 |
A/A |
|
ColumnReadoutUniformityOverTimeGrade |
Column Read. Unif. Grade 50/150 |
A/A |
|
ColumnUniformityGrade |
Column Uniformity Grade |
A |
|
NoiseGrade |
Noise Grade |
A |
|
Efficiency Interpolation: C11
InterpolatedEfficiency50 |
Interpol. Efficiency 50 |
99.87 |
|
InterpolatedEfficiency120 |
Interpol. Efficiency 120 |
99.35 |
|
Efficiency Distr. 150: C11
N |
N |
4160 |
|
mu |
μ |
99.08 |
|
sigma |
σ |
1.61 |
|
Efficiency Distr. 250: C11
N |
N |
4160 |
|
mu |
μ |
97.74 |
|
sigma |
σ |
3.22 |
|
Efficiency Distr. 100: C11
N |
N |
4160 |
|
mu |
μ |
99.63 |
|
sigma |
σ |
0.92 |
|
Efficiency Distr. 50: C11
N |
N |
4160 |
|
mu |
μ |
99.90 |
|
sigma |
σ |
0.45 |
|
Efficiency Distr. 200: C11
N |
N |
4160 |
|
mu |
μ |
97.90 |
|
sigma |
σ |
3.08 |
|
Background Map 150: C11
RealHitrate |
Real Hitrate |
122.58 |
MHz/cm2 |
Background Map 250: C11
RealHitrate |
Real Hitrate |
170.32 |
MHz/cm2 |
Background Map 100: C11
RealHitrate |
Real Hitrate |
84.80 |
MHz/cm2 |
Background Map 50: C11
RealHitrate |
Real Hitrate |
42.53 |
MHz/cm2 |
Background Map 200: C11
RealHitrate |
Real Hitrate |
165.66 |
MHz/cm2 |
Hit Map 50: C11
RealHitrate |
Real Hitrate |
42.03 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
1 |
|
Bump Bonding Defects 50: C11
Hit Map 150: C11
RealHitrate |
Real Hitrate |
121.83 |
MHz/cm2 |
NumberOfDefectivePixels |
# Defective Pixels |
0 |
|
Bump Bonding Defects 150: C11
Col. Read. Unif. 50: C11
N |
N |
5914332 |
|
mu |
μ |
182069 |
|
sigma |
σ |
426.70 |
|
Col. Read. Unif. 150: C11
N |
N |
17176115 |
|
mu |
μ |
512963 |
|
sigma |
σ |
716.21 |
|
Read. Unif. over Time 50: C11
N |
N |
6801375 |
|
mu |
μ |
6891 |
|
sigma_th |
σ_th |
83.01 |
|
Time unif. distribution 50: C11
chi2/ndf |
chi2/ndf |
3.28 |
|
sigma |
σ |
92.19 |
|
sigma_th |
σ_th |
83.03 |
|
Read. Unif. over Time 150: C11
N |
N |
19706831 |
|
mu |
μ |
19966 |
|
sigma_th |
σ_th |
141.30 |
|
Time unif. distribution 150: C11
chi2/ndf |
chi2/ndf |
6.22 |
|
sigma |
σ |
161.32 |
|
sigma_th |
σ_th |
141.36 |
|
Col. Uniformity Ratio: C11
Col. Uniformity per Event: C11 50
Col. Uniformity per Event: C11 150
S-Curve widths: Noise (e^{-}) C11 100
N |
N |
3608 |
|
mu |
μ |
414.44 |
|
sigma |
σ |
161.80 |
|
threshold |
thr |
4087.69 |
|
fit_peak |
fit peak |
311 |
|
fit_skewness |
ɣ1 |
8.81e-01 |
|
under |
<= |
167.00 |
|
over |
>= |
385.00 |
|