Test Date: 2015-07-07 08:07
Chip 1
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 50/150 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 50/150 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 50/150 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 50/150 0/0
BumpBondingDefects # Bump Bonding Defects 50/150 0/0
Efficiency Efficiency 50/120 99.86/99.28
EfficiencyGrade Efficiency Grade 50/120 (A)/A
HotPixelsGrade Hot Pixels Grade 50/150 (A)/(A)
HitMapGrade Hit Map Grade 50/150 (A)/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 50/150 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 50/150 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C1
InterpolatedEfficiency50 Interpol. Efficiency 50 99.86
InterpolatedEfficiency120 Interpol. Efficiency 120 99.28
Efficiency Distr. 150: C1
N N 4160
mu μ 99.66
sigma σ 1.72
Efficiency Distr. 250: C1
N N 4160
mu μ 99.27
sigma σ 1.97
Efficiency Distr. 100: C1
N N 4160
mu μ 99.83
sigma σ 1.64
Efficiency Distr. 50: C1
N N 4160
mu μ 99.92
sigma σ 1.59
Efficiency Distr. 200: C1
N N 4160
mu μ 99.31
sigma σ 1.89
Background Map 150: C1
RealHitrate Real Hitrate 80.03 MHz/cm2
Background Map 250: C1
RealHitrate Real Hitrate 113.31 MHz/cm2
Background Map 100: C1
RealHitrate Real Hitrate 54.86 MHz/cm2
Background Map 50: C1
RealHitrate Real Hitrate 27.00 MHz/cm2
Background Map 200: C1
RealHitrate Real Hitrate 108.95 MHz/cm2
Hit Map 50: C1
RealHitrate Real Hitrate 26.89 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 50: C1
Hit Map 150: C1
RealHitrate Real Hitrate 79.96 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
Bump Bonding Defects 150: C1
Col. Read. Unif. 50: C1
N N 3877820
mu μ 93356
sigma σ 305.54
Col. Read. Unif. 150: C1
N N 11535000
mu μ 270954
sigma σ 520.53
Read. Unif. over Time 50: C1
N N 4350916
mu μ 4408
sigma_th σ_th 66.39
Time unif. distribution 50: C1
chi2/ndf chi2/ndf 2.09
sigma σ 69.23
sigma_th σ_th 66.41
Read. Unif. over Time 150: C1
N N 12935023
mu μ 13105
sigma_th σ_th 114.48
Time unif. distribution 150: C1
chi2/ndf chi2/ndf 2.18
sigma σ 123.54
sigma_th σ_th 114.53
Col. Uniformity Ratio: C1
Col. Uniformity per Event: C1 50
Col. Uniformity per Event: C1 150
S-Curve widths: Noise (e^{-}) C1 100
N N 4153
mu μ 319.03
sigma σ 74.23
threshold thr 3161.10
fit_peak fit peak 284
fit_skewness ​ɣ​1 6.98e-01
under <= 7.00