Test Date: 2016-11-07 11:20
Analysis date: 2016-11-15 13:43
M1132 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M1132
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 39 - 16/0/0
DeadPixels Dead Pixels 3
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 30
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 5
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center PSI
TestDate Test Date 2016-11-07
TestTime Test Time 11:20
TestDuration Duration 1:23:46
TempC Temparature -20 °C
TBM1 TBM1 ok, 0x08 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar v2.1.0+875 gda35c4c
DTB_FW DTB FW 4.7
ModuleIa Module Ia 380.2 mA
Summary 3
Noise Noise 133.79 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 56.47 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.05 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 4061.28 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.81
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 11.92 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.26 μA
CurrentVariation I(150 V) / I(100 V) 1.95
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.26 μA
Variation I(150 V) / I(100 V) 1.95
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 11.92 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.95
CurrentRatio100V I(+17C)/I(-20C) 100V 3.84
CurrentRatio150V I(+17C)/I(-20C) 150V 2.66
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
mu μ 111.81
caldelspread CalDel spread 49
PHScale
mu μ 50.25
phscalespread PHScale spread 27
PHOffset
mu μ 101.19
phoffsetspread PHOffset spread 45
VthrComp
mu μ 116.88
vthrcompspread VthrComp spread 31
Vtrim
mu μ 138.69
vtrimspread Vtrim spread 33
Vana
mu μ 72.75
vanaspread Vana spread 21
Digital Current
Duration Duration 1:23:46
MinCurrent min. Current 0.615 A
MaxCurrent max. Current 0.678 A
Analog Current
Duration Duration 1:23:46
MinCurrent min. Current 0.074 A
MaxCurrent max. Current 0.384 A
ModuleIa Module Ia 380.2 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.35
Min min 19.30
Max max 20.10
NROCsNotProgrammable ROCs not programmable 0
Temperature
Temperature Temp. while test -20.00 +/- 0.01 °C
Duration Duration of test 1:24:45
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
0
0
0
0
0
0
2
0
0
0
139.54
1747
54
0.043
4058
Chip 1
A
3
0
0
1
0
0
0
2
0
0
0
135.69
1752
63
0.047
4517
Chip 2
A
1
0
0
1
0
0
0
0
0
0
0
137.31
1747
55
0.037
3527
Chip 3
A
16
0
0
0
1
0
0
15
0
0
0
151.50
1756
64
0.059
4544
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
130.20
1750
52
0.049
3704
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
122.05
1748
53
0.035
3136
Chip 6
A
2
0
0
0
0
0
0
2
0
0
0
139.80
1750
62
0.056
4553
Chip 7
A
3
0
0
1
0
0
0
2
0
0
0
139.03
1757
65
0.044
4152
Chip 8
A
5
1
0
2
0
0
0
2
0
0
0
136.30
1748
59
0.045
3592
Chip 9
A
2
1
0
0
0
0
0
1
0
0
0
125.42
1749
55
0.041
4644
Chip 10
A
2
1
0
0
0
0
0
1
0
0
0
151.06
1750
55
0.039
4296
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
116.75
1750
52
0.041
4371
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
122.16
1749
48
0.047
3713
Chip 13
A
1
0
0
0
0
0
0
1
0
0
0
135.32
1750
57
0.058
3793
Chip 14
A
1
0
0
0
0
0
0
1
0
0
0
122.38
1748
52
0.045
4370
Chip 15
A
1
0
0
0
0
0
0
1
0
0
0
136.12
1750
57
0.035
4010
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
ModifiedGrading Modified Grading True
GradingParameters_OnShellQuickTest_LeakageCurrent_C OnShellQuickTest_LeakageCurrent_C 10.0 => 15.0
GradingParameters_par1Max par1Max 7. => +99999
GradingParameters_leakageCurrentRatioB leakageCurrentRatioB 20 => -999
GradingParameters_OnShellQuickTest_LeakageCurrent_B OnShellQuickTest_LeakageCurrent_B 2.0 => 999.0
GradingParameters_par1Min par1Min 0. => -99999
GradingParameters_gainMax gainMax 5.0 => 8.0
GradingParameters_par1C par1C 2000. => 200000.
GradingParameters_par1B par1B 1000. => 100000.
GradingParameters_pedestalC pedestalC 5000 => 500000
GradingParameters_pedestalB pedestalB 2500 => 250000
TBM
nTBMs n 2
TBMType Type tbm10c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0x08
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
Core1a_basea Core 1a base a 0xed
Core1a_basee Core 1a base e 0x08
Core1b_basea Core 1b base a 0xed
Core1b_basee Core 1b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 2
Phase160 Phase 160 0
Logfile

Overview

Errors
nCriticals # Criticals 0
nErrors # Errors 45
nWarnings # Warnings 0
channel_0_count Channel 0 8
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_eventid_count Event ID mismatch 8
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