Test Date: 2016-10-26 11:02
Analysis date: 2016-10-26 16:18
M1083 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M1083
Grade Grade B
ElectricalGrade Electrical Grade B
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 179 - 15/1/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 24
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 14
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 141
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center PSI
TestDate Test Date 2016-10-26
TestTime Test Time 11:02
TestDuration Duration 1:25:14
TempC Temparature -20 °C
TBM1 TBM1 ok, 0xf8 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar v2.1.0+867 g2c7f7f2
DTB_FW DTB FW 4.7
ModuleIa Module Ia 389.1 mA
Summary 3
Noise Noise 135.57 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 55.38 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 15/1/0
PedestalSpread Pedestal Spread 4013.84 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.86
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.83 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.02 μA
CurrentVariation I(150 V) / I(100 V) 1.35
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.02 μA
Variation I(150 V) / I(100 V) 1.35
recalculatedCurrentAtVoltage150V I_rec(150 V) @ 17°C 0.83 μA
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 1.35
CurrentRatio100V I(+17C)/I(-20C) 100V 29.43
CurrentRatio150V I(+17C)/I(-20C) 150V 24.71
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
CalDel
mu μ 100.38
caldelspread CalDel spread 33
PHScale
mu μ 53.94
phscalespread PHScale spread 44
PHOffset
mu μ 114.06
phoffsetspread PHOffset spread 50
VthrComp
mu μ 120.12
vthrcompspread VthrComp spread 21
Vtrim
mu μ 132.00
vtrimspread Vtrim spread 33
Vana
mu μ 76.88
vanaspread Vana spread 22
Digital Current
Duration Duration 1:25:14
MinCurrent min. Current 0.601 A
MaxCurrent max. Current 0.669 A
Analog Current
Duration Duration 1:25:14
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.392 A
ModuleIa Module Ia 389.1 mA
IanaLoss
IanaLossProblems Iana problems No
Mean mean 19.75
Min min 19.30
Max max 20.90
NROCsNotProgrammable ROCs not programmable 0
Temperature
Temperature Temp. while test -20.06 +/- 0.05 °C
Duration Duration of test 0:02:05
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
3
0
0
0
0
0
0
3
0
0
0
135.33
1748
57
0.040
3644
Chip 1
A
1
0
0
1
0
0
0
0
0
0
0
117.02
1745
54
0.040
3334
Chip 2
A
1
0
0
1
0
0
0
0
0
0
0
121.36
1748
53
0.040
4104
Chip 3
A
0
0
0
0
0
0
0
0
0
0
0
124.51
1748
52
0.040
4512
Chip 4
A
1
0
0
0
0
0
0
1
0
0
0
133.60
1750
56
0.040
3851
Chip 5
A
3
0
0
0
0
0
0
3
0
0
0
128.96
1748
52
0.041
3990
Chip 6
A
3
0
0
3
0
0
0
0
0
0
0
119.63
1748
50
0.039
4154
Chip 7
A
0
0
0
0
0
0
0
0
0
0
0
116.00
1746
50
0.035
3882
Chip 8
A
8
0
0
7
0
0
0
1
0
0
0
146.40
1754
68
0.047
5059
Chip 9
A
12
0
0
1
0
0
0
11
0
0
0
152.59
1752
60
0.045
3772
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
128.83
1745
52
0.032
3616
Chip 11
A
2
0
0
0
0
0
0
2
0
0
0
140.49
1743
56
0.040
3884
Chip 12
B
141
0
0
0
0
0
0
0
141
0
0
172.38
1746
60
0.057
4024
Chip 13
A
3
0
0
1
0
0
0
2
0
0
0
154.52
1748
55
0.054
4482
Chip 14
A
1
0
0
0
0
0
0
1
0
0
0
131.73
1748
54
0.039
4188
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
145.74
1749
58
0.038
3726
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
Readback par0ia
Readback par1ia
Readback par2ia
GradingParameters
ModifiedGrading Modified Grading True
GradingParameters_OnShellQuickTest_LeakageCurrent_C OnShellQuickTest_LeakageCurrent_C 10.0 => 15.0
GradingParameters_par1Max par1Max 7. => +99999
GradingParameters_leakageCurrentRatioB leakageCurrentRatioB 20 => -999
GradingParameters_OnShellQuickTest_LeakageCurrent_B OnShellQuickTest_LeakageCurrent_B 2.0 => 999.0
GradingParameters_par1Min par1Min 0. => -99999
GradingParameters_gainMax gainMax 5.0 => 8.0
GradingParameters_par1C par1C 2000. => 200000.
GradingParameters_par1B par1B 1000. => 100000.
GradingParameters_pedestalC pedestalC 5000 => 500000
GradingParameters_pedestalB pedestalB 2500 => 250000
TBM
nTBMs n 2
TBMType Type tbm10c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
Core1a_basea Core 1a base a 0xed
Core1a_basee Core 1a base e 0xf8
Core1b_basea Core 1b base a 0xed
Core1b_basee Core 1b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 6
Phase160 Phase 160 7
Logfile

Overview

Errors
nCriticals # Criticals 0
nErrors # Errors 34
nWarnings # Warnings 0
channel_0_count Channel 0 6
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_eventid_count Event ID mismatch 6
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