Test Date: 2015-10-07 14:47
Analysis date: 2016-05-26 06:06
Chip 14
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 150/50 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 150/50 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 150/50 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 150/50 0/0
BadDoubleColumns # Bad Double Columns 0
BumpBondingDefects # Bump Bonding Defects 150/50 1/1
Efficiency Efficiency 50/120 99.86/99.06
EfficiencyFit Efficiency Fit chi2/ndf: 0.61, # points: 182
EfficiencyGrade Efficiency Grade 50/120 (A)/A
BadDoubleColumnsGrade Bad DC Grade A
HotPixelsGrade Hot Pixels Grade 150/50 A/A
HitMapGrade Hit Map Grade 150/50 A/(A)
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 150/50 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 150/50 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C14
Plot
fitfunction Fit [0]-[1]*x^3
BadDoubleColumns # Bad DCs (excluded from fit) 0
Chi2NDF chi2/ndf 0.61
NumberFitPoints # fit points 182
p0 p0 99.93
p1 p1 5.01e-07
InterpolatedEfficiency50 Interpol. Efficiency 50 99.86
InterpolatedEfficiency120 Interpol. Efficiency 120 99.06
Efficiency Map 25: C14
Efficiency Map 50: C14
Efficiency Map 75: C14
Efficiency Map 100: C14
Efficiency Map 125: C14
Efficiency Map 150: C14
Efficiency Map 175: C14
Efficiency Map 200: C14
Efficiency Map 225: C14
Efficiency Map 250: C14
Efficiency Distr. 25: C14
Plot
N N 4160
mu μ 99.98
sigma σ 0.22
Efficiency Map 300: C14
Efficiency Distr. 50: C14
Plot
N N 4160
mu μ 99.95
sigma σ 0.32
Efficiency Distr. 75: C14
Plot
N N 4160
mu μ 99.91
sigma σ 0.43
Efficiency Distr. 100: C14
Plot
N N 4160
mu μ 99.81
sigma σ 0.64
Efficiency Distr. 125: C14
Plot
N N 4160
mu μ 99.73
sigma σ 0.75
Efficiency Distr. 150: C14
Plot
N N 4160
mu μ 99.56
sigma σ 0.96
Efficiency Distr. 175: C14
Plot
N N 4160
mu μ 99.37
sigma σ 1.14
Efficiency Distr. 200: C14
Plot
N N 4160
mu μ 99.04
sigma σ 1.50
Efficiency Distr. 225: C14
Plot
N N 4160
mu μ 98.60
sigma σ 1.85
Efficiency Distr. 250: C14
Plot
N N 4160
mu μ 98.32
sigma σ 2.06
Background Map 25: C14
Plot
RealHitrate Real Hitrate 14.10 MHz/cm2
Efficiency Distr. 300: C14
Plot
N N 4160
mu μ 97.24
sigma σ 2.89
Background Map 50: C14
Plot
RealHitrate Real Hitrate 28.40 MHz/cm2
Background Map 75: C14
Plot
RealHitrate Real Hitrate 41.88 MHz/cm2
Background Map 100: C14
Plot
RealHitrate Real Hitrate 57.48 MHz/cm2
Background Map 125: C14
Plot
RealHitrate Real Hitrate 69.82 MHz/cm2
Background Map 150: C14
Plot
RealHitrate Real Hitrate 83.42 MHz/cm2
Background Map 175: C14
Plot
RealHitrate Real Hitrate 97.92 MHz/cm2
Background Map 200: C14
Plot
RealHitrate Real Hitrate 112.63 MHz/cm2
Background Map 225: C14
Plot
RealHitrate Real Hitrate 129.12 MHz/cm2
Background Map 250: C14
Plot
RealHitrate Real Hitrate 139.48 MHz/cm2
Background Map 300: C14
Plot
RealHitrate Real Hitrate 164.16 MHz/cm2
Retrim Hot Pix 150: C14
Retrim Hot Pix 0: C14
Masked Hot Pixels 150: C14
Masked Hot Pixels 50: C14
Hit Map 150: C14
Plot
RealHitrate Real Hitrate 81.62 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
BB Defects 150: C14
Hit Map 50: C14
Plot
RealHitrate Real Hitrate 27.72 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
BB Defects 50: C14
Col. Read. Unif. 150: C14
Plot
N N 11695859
mu μ 253824
sigma σ 56313.10
Col. Read. Unif. 50: C14
Plot
N N 3969267
mu μ 86204
sigma σ 19842.48
Read. Unif. over Time 150: C14
Plot
N N 13198826
mu μ 13386
sigma_th σ_th 115.70
Time unif. distribution 150: C14
Plot
chi2/ndf chi2/ndf 0.80
sigma σ 118.68
sigma_th σ_th 115.71
expectation Red curve (expected) Poisson
Read. Unif. over Time 50: C14
Plot
N N 4482633
mu μ 4546
sigma_th σ_th 67.43
Time unif. distribution 50: C14
Plot
chi2/ndf chi2/ndf 0.75
sigma σ 70.96
sigma_th σ_th 67.43
expectation Red curve (expected) Poisson
Col. Uniformity Ratio: C14
Col. Uniformity per Event: C14 150
Plot
mu μ 25.67
sigma fit error of μ 2.18
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
Col. Uniformity per Event: C14 50
Plot
mu μ 25.92
sigma fit error of μ 2.19
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
S-Curve widths: Noise (e^{-}) C14 100
Plot
N N 4160
mu μ 179.39
sigma RMS 16.03
threshold thr 1978.84
fit fit Gaussian
fit_peak μ fit 178.75
fit_sigma σ fit 15.17
MeasuredHitrate Measured hitrate: 57.0
Alive Map: C14
DC Efficiency Distribution: C14
Plot
MeanEfficiency_50 Mean Efficiency 50 MHz/cm2 99.88
MeanEfficiency_120 Mean Efficiency 120 MHz/cm2 99.06
NBadDoubleColumns Bad Double Columns 0
CalDel scan: C14
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