Test Date: 2015-10-07 14:47
Analysis date: 2016-05-26 06:06
Chip 12
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 150/50 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 150/50 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 150/50 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 150/50 0/0
BadDoubleColumns # Bad Double Columns 0
BumpBondingDefects # Bump Bonding Defects 150/50 0/0
Efficiency Efficiency 50/120 99.86/99.05
EfficiencyFit Efficiency Fit chi2/ndf: 0.69, # points: 125
EfficiencyGrade Efficiency Grade 50/120 (A)/A
BadDoubleColumnsGrade Bad DC Grade A
HotPixelsGrade Hot Pixels Grade 150/50 A/A
HitMapGrade Hit Map Grade 150/50 A/(A)
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 150/50 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 150/50 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C12
Plot
fitfunction Fit [0]-[1]*x^3
BadDoubleColumns # Bad DCs (excluded from fit) 0
Chi2NDF chi2/ndf 0.69
NumberFitPoints # fit points 125
p0 p0 99.93
p1 p1 5.07e-07
InterpolatedEfficiency50 Interpol. Efficiency 50 99.86
InterpolatedEfficiency120 Interpol. Efficiency 120 99.05
Efficiency Map 25: C12
Efficiency Map 50: C12
Efficiency Map 75: C12
Efficiency Map 100: C12
Efficiency Map 125: C12
Efficiency Map 150: C12
Efficiency Map 175: C12
Efficiency Map 200: C12
Efficiency Map 225: C12
Efficiency Map 250: C12
Efficiency Distr. 25: C12
Plot
N N 4160
mu μ 99.95
sigma σ 0.31
Efficiency Map 300: C12
Efficiency Distr. 50: C12
Plot
N N 4160
mu μ 99.87
sigma σ 0.53
Efficiency Distr. 75: C12
Plot
N N 4160
mu μ 99.76
sigma σ 0.71
Efficiency Distr. 100: C12
Plot
N N 4160
mu μ 99.46
sigma σ 1.10
Efficiency Distr. 125: C12
Plot
N N 4160
mu μ 99.06
sigma σ 1.49
Efficiency Distr. 150: C12
Plot
N N 4160
mu μ 98.53
sigma σ 1.98
Efficiency Distr. 175: C12
Plot
N N 4160
mu μ 97.71
sigma σ 2.73
Efficiency Distr. 200: C12
Plot
N N 4160
mu μ 96.50
sigma σ 3.69
Efficiency Distr. 225: C12
Plot
N N 4160
mu μ 94.95
sigma σ 4.81
Efficiency Distr. 250: C12
Plot
N N 4160
mu μ 93.66
sigma σ 5.70
Background Map 25: C12
Plot
RealHitrate Real Hitrate 22.94 MHz/cm2
Efficiency Distr. 300: C12
Plot
N N 4160
mu μ 89.83
sigma σ 7.83
Background Map 50: C12
Plot
RealHitrate Real Hitrate 45.45 MHz/cm2
Background Map 75: C12
Plot
RealHitrate Real Hitrate 66.47 MHz/cm2
Background Map 100: C12
Plot
RealHitrate Real Hitrate 90.08 MHz/cm2
Background Map 125: C12
Plot
RealHitrate Real Hitrate 109.98 MHz/cm2
Background Map 150: C12
Plot
RealHitrate Real Hitrate 130.30 MHz/cm2
Background Map 175: C12
Plot
RealHitrate Real Hitrate 152.19 MHz/cm2
Background Map 200: C12
Plot
RealHitrate Real Hitrate 175.23 MHz/cm2
Background Map 225: C12
Plot
RealHitrate Real Hitrate 198.08 MHz/cm2
Background Map 250: C12
Plot
RealHitrate Real Hitrate 214.45 MHz/cm2
Background Map 300: C12
Plot
RealHitrate Real Hitrate 251.88 MHz/cm2
Retrim Hot Pix 150: C12
Retrim Hot Pix 0: C12
Masked Hot Pixels 150: C12
Masked Hot Pixels 50: C12
Hit Map 150: C12
Plot
RealHitrate Real Hitrate 125.95 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
BB Defects 150: C12
Hit Map 50: C12
Plot
RealHitrate Real Hitrate 44.19 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
BB Defects 50: C12
Col. Read. Unif. 150: C12
Plot
N N 17869718
mu μ 391680
sigma σ 99038.45
Col. Read. Unif. 50: C12
Plot
N N 6258239
mu μ 137441
sigma σ 36339.56
Read. Unif. over Time 150: C12
Plot
N N 20367345
mu μ 20657
sigma_th σ_th 143.72
Time unif. distribution 150: C12
Plot
chi2/ndf chi2/ndf 2.87
sigma σ 153.61
sigma_th σ_th 143.73
expectation Red curve (expected) Poisson
Read. Unif. over Time 50: C12
Plot
N N 7146923
mu μ 7248
sigma_th σ_th 85.14
Time unif. distribution 50: C12
Plot
chi2/ndf chi2/ndf 0.81
sigma σ 83.26
sigma_th σ_th 85.14
expectation Red curve (expected) Poisson
Col. Uniformity Ratio: C12
Col. Uniformity per Event: C12 150
Plot
mu μ 25.83
sigma fit error of μ 2.18
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
Col. Uniformity per Event: C12 50
Plot
mu μ 25.97
sigma fit error of μ 2.18
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
S-Curve widths: Noise (e^{-}) C12 100
Plot
N N 4160
mu μ 163.13
sigma RMS 15.77
threshold thr 2069.73
fit fit Gaussian
fit_peak μ fit 162.74
fit_sigma σ fit 15.06
MeasuredHitrate Measured hitrate: 89.5
Alive Map: C12
DC Efficiency Distribution: C12
Plot
MeanEfficiency_50 Mean Efficiency 50 MHz/cm2 99.88
MeanEfficiency_120 Mean Efficiency 120 MHz/cm2 99.05
NBadDoubleColumns Bad Double Columns 0
CalDel scan: C12
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