Test Date: 2015-10-07 14:47
Analysis date: 2016-05-26 06:06
Chip 11
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 150/50 0/0
NumberOfNonUniformColumns # Non-Uniform Columns 150/50 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 150/50 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 150/50 0/0
BadDoubleColumns # Bad Double Columns 0
BumpBondingDefects # Bump Bonding Defects 150/50 0/0
Efficiency Efficiency 50/120 99.88/99.35
EfficiencyFit Efficiency Fit chi2/ndf: 0.56, # points: 107
EfficiencyGrade Efficiency Grade 50/120 (A)/A
BadDoubleColumnsGrade Bad DC Grade A
HotPixelsGrade Hot Pixels Grade 150/50 A/A
HitMapGrade Hit Map Grade 150/50 A/(A)
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 150/50 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 150/50 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C11
Plot
fitfunction Fit [0]-[1]*x^3
BadDoubleColumns # Bad DCs (excluded from fit) 0
Chi2NDF chi2/ndf 0.56
NumberFitPoints # fit points 107
p0 p0 99.92
p1 p1 3.28e-07
InterpolatedEfficiency50 Interpol. Efficiency 50 99.88
InterpolatedEfficiency120 Interpol. Efficiency 120 99.35
Efficiency Map 25: C11
Efficiency Map 50: C11
Efficiency Map 75: C11
Efficiency Map 100: C11
Efficiency Map 125: C11
Efficiency Map 150: C11
Efficiency Map 175: C11
Efficiency Map 200: C11
Efficiency Map 225: C11
Efficiency Map 250: C11
Efficiency Distr. 25: C11
Plot
N N 4160
mu μ 99.96
sigma σ 0.30
Efficiency Map 300: C11
Efficiency Distr. 50: C11
Plot
N N 4160
mu μ 99.87
sigma σ 0.51
Efficiency Distr. 75: C11
Plot
N N 4160
mu μ 99.75
sigma σ 0.74
Efficiency Distr. 100: C11
Plot
N N 4160
mu μ 99.43
sigma σ 1.17
Efficiency Distr. 125: C11
Plot
N N 4160
mu μ 99.04
sigma σ 1.68
Efficiency Distr. 150: C11
Plot
N N 4160
mu μ 98.51
sigma σ 2.32
Efficiency Distr. 175: C11
Plot
N N 4160
mu μ 97.53
sigma σ 3.36
Efficiency Distr. 200: C11
Plot
N N 4160
mu μ 96.30
sigma σ 4.64
Efficiency Distr. 225: C11
Plot
N N 4160
mu μ 94.64
sigma σ 5.94
Efficiency Distr. 250: C11
Plot
N N 4160
mu μ 93.26
sigma σ 7.09
Background Map 25: C11
Plot
RealHitrate Real Hitrate 26.09 MHz/cm2
Efficiency Distr. 300: C11
Plot
N N 4160
mu μ 89.19
sigma σ 9.63
Background Map 50: C11
Plot
RealHitrate Real Hitrate 51.53 MHz/cm2
Background Map 75: C11
Plot
RealHitrate Real Hitrate 75.03 MHz/cm2
Background Map 100: C11
Plot
RealHitrate Real Hitrate 101.94 MHz/cm2
Background Map 125: C11
Plot
RealHitrate Real Hitrate 123.94 MHz/cm2
Background Map 150: C11
Plot
RealHitrate Real Hitrate 146.83 MHz/cm2
Background Map 175: C11
Plot
RealHitrate Real Hitrate 171.64 MHz/cm2
Background Map 200: C11
Plot
RealHitrate Real Hitrate 196.70 MHz/cm2
Background Map 225: C11
Plot
RealHitrate Real Hitrate 223.75 MHz/cm2
Background Map 250: C11
Plot
RealHitrate Real Hitrate 241.69 MHz/cm2
Background Map 300: C11
Plot
RealHitrate Real Hitrate 285.78 MHz/cm2
Retrim Hot Pix 150: C11
Retrim Hot Pix 0: C11
Masked Hot Pixels 150: C11
Masked Hot Pixels 50: C11
Hit Map 150: C11
Plot
RealHitrate Real Hitrate 143.86 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
BB Defects 150: C11
Hit Map 50: C11
Plot
RealHitrate Real Hitrate 50.55 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
BB Defects 50: C11
Col. Read. Unif. 150: C11
Plot
N N 20319502
mu μ 447371
sigma σ 125076.93
Col. Read. Unif. 50: C11
Plot
N N 7124003
mu μ 157229
sigma σ 46402.37
Read. Unif. over Time 150: C11
Plot
N N 23263306
mu μ 23594
sigma_th σ_th 153.60
Time unif. distribution 150: C11
Plot
chi2/ndf chi2/ndf 7.44
sigma σ 173.16
sigma_th σ_th 153.61
expectation Red curve (expected) Poisson
Read. Unif. over Time 50: C11
Plot
N N 8175921
mu μ 8292
sigma_th σ_th 91.06
Time unif. distribution 50: C11
Plot
chi2/ndf chi2/ndf 1.09
sigma σ 89.37
sigma_th σ_th 91.06
expectation Red curve (expected) Poisson
Col. Uniformity Ratio: C11
Col. Uniformity per Event: C11 150
Plot
mu μ 24.29
sigma fit error of μ 2.19
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
Col. Uniformity per Event: C11 50
Plot
mu μ 24.41
sigma fit error of μ 2.20
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
S-Curve widths: Noise (e^{-}) C11 100
Plot
N N 4160
mu μ 169.11
sigma RMS 16.15
threshold thr 2170.18
fit fit Gaussian
fit_peak μ fit 168.82
fit_sigma σ fit 15.67
MeasuredHitrate Measured hitrate: 101.0
Alive Map: C11
DC Efficiency Distribution: C11
Plot
MeanEfficiency_50 Mean Efficiency 50 MHz/cm2 99.89
MeanEfficiency_120 Mean Efficiency 120 MHz/cm2 99.35
NBadDoubleColumns Bad Double Columns 0
CalDel scan: C11
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