Test Date: 2016-11-07 16:36
Analysis date: 2016-11-07 17:20
Chip 14
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 300/100 2/2
NumberOfNonUniformColumns # Non-Uniform Columns 300/100 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 300/100 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 300/100 0/0
BadDoubleColumns # Bad Double Columns 0
BumpBondingDefects # Bump Bonding Defects 300/100 0/0
Efficiency Efficiency 150/300 99.82/99.53
EfficiencyFit Efficiency Fit chi2/ndf: 0.30, # points: 103
EfficiencyGrade Efficiency Grade 150/300 A/A
BadDoubleColumnsGrade Bad DC Grade A
HotPixelsGrade Hot Pixels Grade 300/100 A/A
HitMapGrade Hit Map Grade 300/100 A/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 300/100 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 300/100 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C14
Plot
fitfunction Fit [0]-[1]*x-[2]*x**2
BadDoubleColumns # Bad DCs (excluded from fit) 0
Chi2NDF chi2/ndf 0.30
NumberFitPoints # fit points 103
p0 p0 99.88
p1 p1 -3.26e-04
InterpolatedEfficiency150 Interpol. Efficiency 150 99.82
InterpolatedEfficiency300 Interpol. Efficiency 300 99.53
Efficiency Map 50: C14
Efficiency Map 100: C14
Efficiency Map 150: C14
Efficiency Map 200: C14
Efficiency Map 250: C14
Efficiency Map 300: C14
Efficiency Map 400: C14
Efficiency Distr. 50: C14
Plot
N N 4160
mu μ 99.92
sigma σ 2.21
Efficiency Distr. 100: C14
Plot
N N 4160
mu μ 99.88
sigma σ 2.22
Efficiency Distr. 150: C14
Plot
N N 4160
mu μ 99.84
sigma σ 2.24
Efficiency Distr. 200: C14
Plot
N N 4160
mu μ 99.79
sigma σ 2.26
Efficiency Distr. 250: C14
Plot
N N 4160
mu μ 99.73
sigma σ 2.29
Efficiency Distr. 300: C14
Plot
N N 4160
mu μ 99.70
sigma σ 2.30
Efficiency Distr. 400: C14
Plot
N N 4160
mu μ 99.61
sigma σ 2.33
Background Map 50: C14
Plot
RealHitrate Real Hitrate 30.74 MHz/cm2
Background Map 100: C14
Plot
RealHitrate Real Hitrate 62.53 MHz/cm2
Background Map 150: C14
Plot
RealHitrate Real Hitrate 94.34 MHz/cm2
Background Map 200: C14
Plot
RealHitrate Real Hitrate 126.85 MHz/cm2
Background Map 250: C14
Plot
RealHitrate Real Hitrate 158.93 MHz/cm2
Background Map 300: C14
Plot
RealHitrate Real Hitrate 191.98 MHz/cm2
Background Map 400: C14
Plot
RealHitrate Real Hitrate 244.60 MHz/cm2
Retrim Hot Pix 150: C14
Retrim Hot Pix 50: C14
Masked Hot Pixels 300: C14
Masked Hot Pixels 100: C14
Hit Map 300: C14
Plot
RealHitrate Real Hitrate 188.16 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 0
BB Defects 300: C14
Hit Map 100: C14
Plot
RealHitrate Real Hitrate 60.92 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
BB Defects 100: C14
Col. Read. Unif. 300: C14
Plot
N N 5640318
mu μ 118915
sigma σ 11002.03
Col. Read. Unif. 100: C14
Plot
N N 1829566
mu μ 38521
sigma σ 3351.08
Read. Unif. over Time 300: C14
Plot
N N 6172774
mu μ 6173
sigma_th σ_th 78.57
Time unif. distribution 300: C14
Plot
chi2/ndf chi2/ndf 1.69
sigma σ 82.45
sigma_th σ_th 78.57
expectation Red curve (expected) Poisson
Read. Unif. over Time 100: C14
Plot
N N 1998608
mu μ 1999
sigma_th σ_th 44.71
Time unif. distribution 100: C14
Plot
chi2/ndf chi2/ndf 1.22
sigma σ 44.26
sigma_th σ_th 44.71
expectation Red curve (expected) Poisson
Col. Uniformity Ratio: C14
Col. Uniformity per Event: C14 300
Plot
mu μ 26.08
sigma fit error of μ 2.14
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
Col. Uniformity per Event: C14 100
Plot
mu μ 26.63
sigma fit error of μ 2.14
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
S-Curve widths: Noise (e^{-}) C14 250
Plot
N N 4138
mu μ 363.62
sigma RMS 103.13
threshold thr 3655.42
fit fit Gaussian
fit_peak μ fit 350.61
fit_sigma σ fit 79.61
MeasuredHitrate Measured hitrate: 74.4
under <= 6.00
over >= 16.00
Alive Map: C14
DC Efficiency Distribution: C14
Plot
MeanEfficiency_150 Mean Efficiency 150 MHz/cm2 99.82
MeanEfficiency_300 Mean Efficiency 300 MHz/cm2 99.57
NBadDoubleColumns Bad Double Columns 0
CalDel scan: C14
v1.1.1-1-g54fa876 on branch master