Test Date: 2016-11-14 17:33
Analysis date: 2016-11-14 18:19
Chip 14
Grading
ROCGrade Final ROC Grade A
NumberOfHotPixels # Hot Pixels 300/100 2/2
NumberOfNonUniformColumns # Non-Uniform Columns 300/100 0
NumberOfNonUniformEvents # Non-Uniform ROC Events 300/100 0/0
NumberOfNonUniformColumnEvents # Non-Uniform Col. Events 300/100 0/0
BadDoubleColumns # Bad Double Columns 0
BumpBondingDefects # Bump Bonding Defects 300/100 0/0
Efficiency Efficiency 150/300 99.81/99.56
EfficiencyFit Efficiency Fit chi2/ndf: 0.32, # points: 119
EfficiencyGrade Efficiency Grade 150/300 A/A
BadDoubleColumnsGrade Bad DC Grade A
HotPixelsGrade Hot Pixels Grade 300/100 A/A
HitMapGrade Hit Map Grade 300/100 A/A
ReadoutUniformityOverTimeGrade ROC Read. Unif. Grade 300/100 A/A
ColumnReadoutUniformityOverTimeGrade Column Read. Unif. Grade 300/100 A/A
ColumnUniformityGrade Column Uniformity Grade A
NoiseGrade Noise Grade A
Efficiency Interpolation: C14
Plot
fitfunction Fit [0]-[1]*x-[2]*x**2
BadDoubleColumns # Bad DCs (excluded from fit) 0
Chi2NDF chi2/ndf 0.32
NumberFitPoints # fit points 119
p0 p0 100.03
p1 p1 1.30e-03
InterpolatedEfficiency150 Interpol. Efficiency 150 99.81
InterpolatedEfficiency300 Interpol. Efficiency 300 99.56
Efficiency Map 50: C14
Efficiency Map 100: C14
Efficiency Map 150: C14
Efficiency Map 200: C14
Efficiency Map 250: C14
Efficiency Map 300: C14
Efficiency Map 400: C14
Efficiency Distr. 50: C14
Plot
N N 4160
mu μ 99.91
sigma σ 2.21
Efficiency Distr. 100: C14
Plot
N N 4160
mu μ 99.87
sigma σ 2.23
Efficiency Distr. 150: C14
Plot
N N 4160
mu μ 99.80
sigma σ 2.26
Efficiency Distr. 200: C14
Plot
N N 4160
mu μ 99.74
sigma σ 2.29
Efficiency Distr. 250: C14
Plot
N N 4160
mu μ 99.65
sigma σ 2.32
Efficiency Distr. 300: C14
Plot
N N 4160
mu μ 99.58
sigma σ 2.35
Efficiency Distr. 400: C14
Plot
N N 4160
mu μ 99.47
sigma σ 2.41
Background Map 50: C14
Plot
RealHitrate Real Hitrate 40.40 MHz/cm2
Background Map 100: C14
Plot
RealHitrate Real Hitrate 81.13 MHz/cm2
Background Map 150: C14
Plot
RealHitrate Real Hitrate 122.69 MHz/cm2
Background Map 200: C14
Plot
RealHitrate Real Hitrate 163.33 MHz/cm2
Background Map 250: C14
Plot
RealHitrate Real Hitrate 204.87 MHz/cm2
Background Map 300: C14
Plot
RealHitrate Real Hitrate 244.63 MHz/cm2
Background Map 400: C14
Plot
RealHitrate Real Hitrate 303.27 MHz/cm2
Retrim Hot Pix 150: C14
Retrim Hot Pix 50: C14
Masked Hot Pixels 300: C14
Masked Hot Pixels 100: C14
Hit Map 300: C14
Plot
RealHitrate Real Hitrate 243.59 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
BB Defects 300: C14
Hit Map 100: C14
Plot
RealHitrate Real Hitrate 80.08 MHz/cm2
NumberOfDefectivePixels # Defective Pixels 1
BB Defects 100: C14
Col. Read. Unif. 300: C14
Plot
N N 7241831
mu μ 153954
sigma σ 21742.59
Col. Read. Unif. 100: C14
Plot
N N 2383068
mu μ 50615
sigma σ 6995.98
Read. Unif. over Time 300: C14
Plot
N N 7990892
mu μ 7991
sigma_th σ_th 89.39
Time unif. distribution 300: C14
Plot
chi2/ndf chi2/ndf 2.34
sigma σ 96.12
sigma_th σ_th 89.39
expectation Red curve (expected) Poisson
Read. Unif. over Time 100: C14
Plot
N N 2627025
mu μ 2627
sigma_th σ_th 51.25
Time unif. distribution 100: C14
Plot
chi2/ndf chi2/ndf 1.30
sigma σ 53.47
sigma_th σ_th 51.25
expectation Red curve (expected) Poisson
Col. Uniformity Ratio: C14
Col. Uniformity per Event: C14 300
Plot
mu μ 26.96
sigma fit error of μ 2.14
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
Col. Uniformity per Event: C14 100
Plot
mu μ 27.17
sigma fit error of μ 2.14
NumberOfNonUniformColumnEvents Non uniform 10.000 event bins 0
S-Curve widths: Noise (e^{-}) C14 250
Plot
N N 3955
mu μ 427.53
sigma RMS 144.39
threshold thr 3550.54
fit fit Gaussian
fit_peak μ fit 405.80
fit_sigma σ fit 109.96
MeasuredHitrate Measured hitrate: 74.4
under <= 61.00
over >= 144.00
Alive Map: C14
DC Efficiency Distribution: C14
Plot
MeanEfficiency_150 Mean Efficiency 150 MHz/cm2 99.81
MeanEfficiency_300 Mean Efficiency 300 MHz/cm2 99.55
NBadDoubleColumns Bad Double Columns 0
CalDel scan: C14
v1.1.1-1-g54fa876 on branch master