Test Date: 2015-10-30 10:46
Analysis date: 2015-11-23 15:56
M3518 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M3518
Grade Grade B
ElectricalGrade Electrical Grade B
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 321 - 13/3/0
DeadPixels Dead Pixels 316
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 4
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 0
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 149
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center Perugia
TestDate Test Date 2015-10-30
TestTime Test Time 10:46
TestDuration Test Duration 1:37:13
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-11
ModuleIa Module Ia 393.1 mA
Summary 3
Noise Noise 144.24 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 49.25 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1257.94 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.68
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.77 μA
CurrentVariation I(150 V) / I(100 V) 1.16
IVCurve
CurrentAtVoltage150V I(150 V) 0.77 μA
Variation I(150 V) / I(100 V) 1.16
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:37:13
MinCurrent min. Current 0.356 A
MaxCurrent max. Current 0.468 A
Analog Current
Duration Duration 1:37:13
MinCurrent min. Current 0.071 A
MaxCurrent max. Current 0.396 A
ModuleIa Module Ia 393.1 mA
Temperature
Temperature Temp. while test 17.01 +/- 0.11 °C
Duration Duration of test 0:04:51
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
1
1
0
0
0
0
0
0
0
0
0
151.30
1754
46
0.027
1418
Chip 1
B
91
89
0
0
0
0
0
2
29
0
0
149.72
1752
55
0.035
1324
Chip 2
B
58
58
0
0
0
0
0
0
18
0
0
141.80
1750
50
0.030
1240
Chip 3
A
3
3
0
0
0
0
0
0
2
0
0
154.44
1752
46
0.035
1412
Chip 4
A
1
1
0
0
0
0
0
0
0
0
0
141.27
1752
48
0.036
1042
Chip 5
A
11
10
0
0
0
0
0
1
8
0
0
134.47
1754
50
0.026
1474
Chip 6
A
39
39
0
0
0
0
0
0
19
0
0
151.16
1749
48
0.033
1490
Chip 7
A
3
3
0
0
0
0
0
0
1
0
0
162.18
1751
54
0.028
1250
Chip 8
A
12
11
0
0
1
0
0
0
12
0
0
141.47
1752
52
0.027
1125
Chip 9
B
44
44
0
0
0
0
0
0
24
0
0
142.19
1750
46
0.036
1088
Chip 10
A
35
34
0
0
0
0
0
1
16
0
0
142.44
1752
53
0.030
1244
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
146.56
1752
49
0.029
1039
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
140.96
1752
46
0.027
1286
Chip 13
A
17
17
0
0
0
0
0
0
14
0
0
127.92
1755
46
0.025
1204
Chip 14
A
6
6
0
0
0
0
0
0
6
0
0
128.38
1749
44
0.027
1255
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
151.54
1750
52
0.035
1236
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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