Test Date: 2015-10-29 13:38
Analysis date: 2015-11-23 15:54
M3513 ModuleFulltest_m20_1
Chips

Overview

_
Vcal Threshold
Summary 1
Module Module M3513
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 27 - 16/0/0
DeadPixels Dead Pixels 22
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 4
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 0
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 10
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 1
BumpBondingMap
Summary 2
TestCenter Test Center Perugia
TestDate Test Date 2015-10-29
TestTime Test Time 13:38
TestDuration Test Duration 1:29:34
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-11
ModuleIa Module Ia 392.3 mA
Summary 3
Noise Noise 136.18 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 50.50 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1116.69 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.77
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:29:34
MinCurrent min. Current 0.361 A
MaxCurrent max. Current 0.52 A
Analog Current
Plot
Duration Duration 1:29:34
MinCurrent min. Current 0.068 A
MaxCurrent max. Current 0.396 A
ModuleIa Module Ia 392.3 mA
Temperature
Plot
Temperature Temp. while test -20.00 +/- 0.05 °C
Duration Duration of test 1:32:33
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
1
1
0
0
0
0
0
0
0
0
0
137.76
 1749
49
0.028
1017
Chip 1
A
6
6
0
0
0
0
0
0
2
0
0
133.52
 1750
52
0.040
1152
Chip 2
A
1
1
0
0
0
0
0
0
1
0
0
149.98
 1750
55
0.028
1234
Chip 3
A
1
0
0
0
0
0
0
1
0
0
0
131.61
 1750
59
0.033
1068
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
130.96
 1749
48
0.041
1084
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
126.76
 1751
46
0.033
1051
Chip 6
A
10
9
0
0
0
0
0
0
7
0
1
131.59
 1752
46
0.036
1185
Chip 7
A
3
3
0
0
0
0
0
0
0
0
0
126.39
 1747
48
0.035
1276
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
143.05
 1748
52
0.025
1099
Chip 9
A
1
0
0
0
0
0
0
1
0
0
0
146.13
 1752
52
0.040
1010
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
137.08
 1749
52
0.033
1158
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
140.41
 1751
49
0.031
1064
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
136.28
 1750
50
0.028
1112
Chip 13
A
2
2
0
0
0
0
0
0
0
0
0
136.45
 1752
50
0.034
1156
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
131.41
 1751
52
0.033
1039
Chip 15
A
2
0
0
0
0
0
0
2
0
0
0
139.48
 1750
50
0.033
1164
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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