Test Date: 2015-10-29 13:38
Analysis date: 2015-11-23 15:51
M3512 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M3512
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 36 - 16/0/0
DeadPixels Dead Pixels 16
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 19
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 1
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 6
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center Perugia
TestDate Test Date 2015-10-29
TestTime Test Time 13:38
TestDuration Test Duration 1:27:27
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x88 0x52
TBM2 TBM2 ok, 0x00 0x52
PxarVersion pXar prod-11
ModuleIa Module Ia 381.9 mA
Summary 3
Noise Noise 151.75 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 55.75 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1334.28 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.72
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 0.60 μA
CurrentVariation I(150 V) / I(100 V) 1.10
IVCurve
CurrentAtVoltage150V I(150 V) 0.60 μA
Variation I(150 V) / I(100 V) 1.10
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:27:27
MinCurrent min. Current 0.365 A
MaxCurrent max. Current 0.481 A
Analog Current
Duration Duration 1:27:27
MinCurrent min. Current 0.059 A
MaxCurrent max. Current 0.385 A
ModuleIa Module Ia 381.9 mA
Temperature
Temperature Temp. while test 16.99 +/- 0.08 °C
Duration Duration of test 1:40:14
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
2
0
0
0
0
0
0
1
0
0
139.54
1752
51
0.027
1446
Chip 1
A
4
3
0
0
0
0
0
1
2
0
0
156.08
1750
56
0.030
1198
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
165.52
1752
56
0.043
1370
Chip 3
A
3
3
0
0
0
0
0
0
0
0
0
168.73
1752
56
0.033
1365
Chip 4
A
0
0
0
0
0
0
0
0
0
0
0
152.36
1750
52
0.030
1196
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
150.26
1750
59
0.029
1246
Chip 6
A
3
3
0
0
0
0
0
0
2
0
0
147.54
1750
52
0.027
1306
Chip 7
A
1
0
0
0
0
0
0
1
0
0
0
151.80
1755
53
0.036
1374
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
145.62
1751
50
0.028
1240
Chip 9
A
1
1
0
0
0
0
0
0
0
0
0
155.53
1752
54
0.031
1193
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
159.64
1751
56
0.029
1470
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
144.64
1750
54
0.027
1247
Chip 12
A
1
1
0
0
0
0
0
0
0
0
0
136.93
1751
56
0.030
1274
Chip 13
A
2
0
0
1
1
0
0
1
1
0
0
149.15
1750
55
0.029
1466
Chip 14
A
2
1
0
0
0
0
0
1
0
0
0
149.14
1752
52
0.035
1538
Chip 15
A
17
2
0
0
0
0
0
15
0
0
0
155.47
1761
81
0.032
1420
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x52
Core0a_basee Core 0a base e 0x88
Core0b_basea Core 0b base a 0x52
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 2
RocDelay_Ch1 Roc Delay Ch1 2
RocDelay_Ch2 Roc Delay Ch2 2
RocDelay_Ch3 Roc Delay Ch3 2
Phase400 Phase 400 2
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 2
nWarnings # Warnings 0
channel_0_count Channel 0 2
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 1
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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