Test Date: 2015-10-29 13:38
Analysis date: 2015-11-23 15:51
M3512 ModuleFulltest_m20_1
Chips

Overview

_
Summary 1
Module Module M3512
Grade Grade C
ElectricalGrade Electrical Grade C
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 381 - 15/0/1
DeadPixels Dead Pixels 17
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 362
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 0
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 7
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 1
Summary 2
TestCenter Test Center Perugia
TestDate Test Date 2015-10-29
TestTime Test Time 13:38
TestDuration Test Duration 1:30:26
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0x98 0x5b
TBM2 TBM2 ok, 0x00 0x5b
PxarVersion pXar prod-11
ModuleIa Module Ia 388.3 mA
Summary 3
Noise Noise 136.07 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 60.75 e
VcalThrWidthROCs Vcal Thr. W. grades 15/0/1
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1236.66 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.76
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:30:26
MinCurrent min. Current 0.367 A
MaxCurrent max. Current 0.551 A
Analog Current
Duration Duration 1:30:26
MinCurrent min. Current 0.057 A
MaxCurrent max. Current 0.392 A
ModuleIa Module Ia 388.3 mA
Temperature
Temperature Temp. while test -20.00 +/- 0.05 °C
Duration Duration of test 1:32:33
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
2
2
0
0
0
0
0
0
1
0
0
128.81
1750
49
0.030
1381
Chip 1
A
4
3
0
0
0
0
0
0
2
0
0
143.71
1751
54
0.033
1116
Chip 2
A
0
0
0
0
0
0
0
0
0
0
0
151.00
1749
56
0.046
1291
Chip 3
A
3
3
0
0
0
0
0
0
1
0
0
144.60
1751
50
0.034
1278
Chip 4
A
1
0
0
0
0
0
0
0
0
0
1
134.48
1752
50
0.030
1132
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
139.32
1750
55
0.030
1163
Chip 6
A
4
3
0
0
0
0
0
1
2
0
0
135.06
1750
49
0.024
1190
Chip 7
A
1
0
0
0
0
0
0
1
0
0
0
131.31
1751
52
0.034
1278
Chip 8
A
1
0
0
0
0
0
0
1
0
0
0
124.38
1752
48
0.028
1129
Chip 9
A
1
1
0
0
0
0
0
0
0
0
0
133.48
1752
54
0.031
1090
Chip 10
A
0
0
0
0
0
0
0
0
0
0
0
138.27
1752
52
0.030
1347
Chip 11
A
0
0
0
0
0
0
0
0
0
0
0
130.85
1753
50
0.030
1149
Chip 12
A
1
1
0
0
0
0
0
0
0
0
0
132.39
1752
54
0.029
1198
Chip 13
A
1
1
0
0
0
0
0
0
1
0
0
130.90
1751
54
0.030
1339
Chip 14
A
1
1
0
0
0
0
0
0
0
0
0
127.73
1754
50
0.031
1368
Chip 15
C
361
2
0
0
0
0
0
359
0
0
0
150.77
1916
196
0.035
1338
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0x5b
Core0a_basee Core 0a base e 0x98
Core0b_basea Core 0b base a 0x5b
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 3
RocDelay_Ch1 Roc Delay Ch1 3
RocDelay_Ch2 Roc Delay Ch2 3
RocDelay_Ch3 Roc Delay Ch3 3
Phase400 Phase 400 6
Phase160 Phase 160 4
Errors
nCriticals # Criticals 0
nErrors # Errors 26
nWarnings # Warnings 0
channel_0_count Channel 0 26
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 25
message_eventid_count Event ID mismatch 1
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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