Test Date: 2015-09-11 11:43
Analysis date: 2015-12-09 10:47
M4080 ModuleFulltest_m20_2
Chips

Overview

_
Vcal Threshold
Summary 1
Module Module M4080
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade None
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 26 - 16/0/0
DeadPixels Dead Pixels 3
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 4
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 18
NoisyPixels Noise Defects 1
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Defects (BB2)
Summary 2
TestCenter Test Center
TestDate Test Date 2015-09-11
TestTime Test Time 11:43
TestDuration Test Duration 1:36:11
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xf8 0xed
TBM2 TBM2 ok, 0x00 0xed
PxarVersion pXar prod-10+20 g6580e80
ModuleIa Module Ia 384.3 mA
Summary 3
Noise Noise 127.56 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 37.91 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.04 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1024.66 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.80
Parameter1ROCs Par1 grades 16/0/0
_
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Plot
Duration Duration 1:36:11
MinCurrent min. Current 0.371 A
MaxCurrent max. Current 0.548 A
Analog Current
Plot
Duration Duration 1:36:11
MinCurrent min. Current 0.074 A
MaxCurrent max. Current 0.486 A
ModuleIa Module Ia 384.3 mA
Temperature
Plot
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
1
0
0
1
0
0
0
0
0
0
0
130.61
 1750
36
0.039
1079
Chip 1
A
4
0
0
4
0
0
0
0
0
0
0
137.07
 1750
36
0.046
1021
Chip 2
A
3
0
0
3
0
0
0
0
0
0
0
141.56
 1748
44
0.041
926
Chip 3
A
2
2
0
0
0
0
0
0
0
0
0
132.16
 1748
41
0.037
1321
Chip 4
A
1
0
0
1
0
0
0
0
0
0
0
117.44
 1752
36
0.028
1078
Chip 5
A
2
0
0
1
1
0
0
1
0
0
0
120.83
 1750
34
0.037
983
Chip 6
A
1
0
0
1
0
0
0
0
0
0
0
120.74
 1749
37
0.034
902
Chip 7
A
1
1
0
0
0
0
0
0
0
0
0
123.70
 1752
38
0.030
1034
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
121.01
 1748
34
0.029
993
Chip 9
A
2
0
0
0
0
0
0
2
0
0
0
132.99
 1749
39
0.034
1090
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
120.41
 1751
36
0.032
861
Chip 11
A
1
0
0
0
0
0
1
0
0
0
0
114.76
 1749
38
0.032
1052
Chip 12
A
2
0
0
2
0
0
0
0
0
0
0
111.98
 1751
36
0.033
866
Chip 13
A
2
0
0
2
0
0
0
0
0
0
0
118.86
 1749
36
0.033
912
Chip 14
A
3
0
0
2
0
0
0
1
0
0
0
152.30
 1750
46
0.047
1105
Chip 15
A
0
0
0
0
0
0
0
0
0
0
0
144.47
 1751
39
0.033
1172
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xed
Core0a_basee Core 0a base e 0xf8
Core0b_basea Core 0b base a 0xed
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 5
RocDelay_Ch1 Roc Delay Ch1 5
RocDelay_Ch2 Roc Delay Ch2 5
RocDelay_Ch3 Roc Delay Ch3 5
Phase400 Phase 400 6
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 4
nWarnings # Warnings 0
channel_0_count Channel 0 4
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 2
message_eventid_count Event ID mismatch 2
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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