Test Date: 2015-11-12 10:21
Analysis date: 2015-12-09 11:01
M4076 ModuleFulltest_p17_1
Chips

Overview

_
Summary 1
Module Module M4076
Grade Grade A
ElectricalGrade Electrical Grade A
IVGrade IV Grade A
ManualGrade Manual Grade None
PixelDefects Pixel Defects - A/B/C 61 - 16/0/0
DeadPixels Dead Pixels 1
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 2
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 57
NoisyPixels Noise Defects 0
TrimProblems Trim Problems 1
PHGainDefects PH Gain Defects 2
PHPar1Defects PH Parameter1 Defects 0
Summary 2
TestCenter Test Center
TestDate Test Date 2015-11-12
TestTime Test Time 10:21
TestDuration Test Duration 1:15:15
TempC Temparature 17 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok, 0xe8 0xe4
TBM2 TBM2 ok, 0x00 0xe4
PxarVersion pXar prod-10+20 g6580e80
ModuleIa Module Ia 387.5 mA
Summary 3
Noise Noise 142.70 e
NoiseROCs Noise grades 16/0/0
VcalThrWidth Vcal Thr. Width 48.09 e
VcalThrWidthROCs Vcal Thr. W. grades 16/0/0
RelGainWidth Rel. Gain Width 0.03 %
RelGainWidthROCs Rel. Gain W. grades 16/0/0
PedestalSpread Pedestal Spread 1078.53 e
PedestalSpreadROCs Ped. Spread grades 16/0/0
Parameter1 Parameter1 0.78
Parameter1ROCs Par1 grades 16/0/0
CurrentAtVoltage150V I(150 V) 1.14 μA
CurrentVariation I(150 V) / I(100 V) 1.26
IVCurve
CurrentAtVoltage150V I(150 V) 1.14 μA
Variation I(150 V) / I(100 V) 1.26
Noise
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
Parameter1
Digital Current
Duration Duration 1:15:15
MinCurrent min. Current 0.363 A
MaxCurrent max. Current 0.482 A
Analog Current
Duration Duration 1:15:15
MinCurrent min. Current 0.072 A
MaxCurrent max. Current 0.482 A
ModuleIa Module Ia 387.5 mA
Temperature
Temperature Temp. while test 0.00 +/- 0.00 °C
Duration Duration of test 0:00:00
Summary ROCs
ROC Grade Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1 Mean noise Thr [e-] Thr width Rel gain width Ped spread
Chip 0
A
3
0
0
2
1
0
0
0
1
0
0
137.98
1749
48
0.036
1134
Chip 1
A
0
0
0
0
0
0
0
0
0
0
0
144.21
1746
50
0.030
1136
Chip 2
A
1
0
0
0
0
0
0
1
0
0
0
154.20
1749
52
0.031
1158
Chip 3
A
1
0
0
0
0
0
0
1
0
0
0
146.03
1748
48
0.035
1096
Chip 4
A
1
1
0
0
0
0
0
0
1
0
0
146.34
1749
48
0.031
960
Chip 5
A
0
0
0
0
0
0
0
0
0
0
0
152.20
1748
50
0.031
964
Chip 6
A
1
0
0
1
0
0
0
0
0
0
0
133.62
1748
45
0.039
928
Chip 7
A
31
0
0
31
0
0
0
0
0
0
0
141.79
1748
47
0.029
1204
Chip 8
A
0
0
0
0
0
0
0
0
0
0
0
148.12
1746
50
0.030
1166
Chip 9
A
1
0
0
1
0
0
0
0
0
0
0
141.73
1752
47
0.031
924
Chip 10
A
1
0
0
1
0
0
0
0
0
0
0
136.68
1753
49
0.031
1125
Chip 11
A
5
0
0
5
0
0
0
0
0
0
0
146.38
1749
50
0.036
1300
Chip 12
A
0
0
0
0
0
0
0
0
0
0
0
129.61
1749
44
0.032
840
Chip 13
A
0
0
0
0
0
0
0
0
0
0
0
138.22
1750
48
0.032
996
Chip 14
A
0
0
0
0
0
0
0
0
0
0
0
150.28
1748
48
0.028
1106
Chip 15
A
16
0
0
16
0
0
0
0
0
0
0
135.82
1748
45
0.035
1220
Readback par0vd
Readback par1vd
Readback par0va
Readback par1va
Readback par0rbia
Readback par1rbia
Readback par0tbia
Readback par1tbia
Readback par2tbia
TBM
nTBMs n 1
TBMType Type tbm08c
Core0a_basea Core 0a base a 0xe4
Core0a_basee Core 0a base e 0xe8
Core0b_basea Core 0b base a 0xe4
Core0b_basee Core 0b base e 0x00
RocDelay_Ch0 Roc Delay Ch0 4
RocDelay_Ch1 Roc Delay Ch1 4
RocDelay_Ch2 Roc Delay Ch2 4
RocDelay_Ch3 Roc Delay Ch3 4
Phase400 Phase 400 2
Phase160 Phase 160 7
Errors
nCriticals # Criticals 0
nErrors # Errors 4
nWarnings # Warnings 0
channel_0_count Channel 0 4
channel_1_count Channel 1 0
channel_2_count Channel 2 0
channel_3_count Channel 3 0
message_tokenchain_count Token Chain Length 2
message_eventid_count Event ID mismatch 2
message_readback_count Readback start marker 0
message_notokenpass_count has NoTokenPass 0
message_datasize_count Data size criticals 0
message_missingevents_count Missing Event criticals 0
message_usbtimeout_count USB criticals 0
message_deser400_count DESER400 failure 0
message_daqerror_count DAQ error 0
GradingParameters
ModifiedGrading Modified Grading False
Logfile

Overview

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