Test Date: 2014-11-17 14:11
R0307 ModuleFullTestPyxar_m20_1
Chips

Overview

_
Vcal Threshold
Summary 1
Module Module R0307
Grade Grade A
PixelDefects Pixel Defects - A/B/C 20 - 1/0/0
DeadPixels Dead Pixels 0
AddressProblems Address Problems 0
ThresholdDefects Threshold Defects 0
MaskDefects Mask Defects 0
DeadBumps Dead Bumps 4
NoisyPixels Noisy Pixels 0
TrimProblems Trim Problems 0
PHGainDefects PH Gain Defects 0
PHPedestalDefects PH Pedestal Defects 0
PHPar1Defects PH Parameter1 Defects 0
Bump Bonding Map
Summary 2
TestDate Test Date 2014-11-17
TestTime Test Time 14:11
TempC Temparature -20 °C
TrimPHCal Trim / phCal yes / yes
TermCycl Term. Cycl. yes
TBM1 TBM1 ok
TBM2 TBM2 ok
Summary 3
Noise Noise 133.83 e
NoiseROCs Noise grades 1/0/0
VcalThrWidth Vcal Thr. Width 71.00 e
VcalThrWidthROCs Vcal Thr. W. grades 1/0/0
RelGainWidth Rel. Gain Width 0.05 %
RelGainWidthROCs Rel. Gain W. grades 1/0/0
PedestalSpread Pedestal Spread 1253.50 e
PedestalSpreadROCs Ped. Spread grades 1/0/0
Parameter1 Parameter1 0.83
Parameter1ROCs Par1 grades 1/0/0
CurrentAtVoltage150V I_rec(150 V) @ 17°C 0.00 μA
CurrentAtVoltage150V_ORIG I_orig(150V) @ -20.0 °C 0.00 μA
CurrentVariation I(150 V) / I(100 V) 1.31
IVCurve
CurrentAtVoltage150V I_orig(150V) @ -20.0 °C 0.00 μA
Variation I(150 V) / I(100 V) 1.31
recalculatedCurrentVariation I_rec(150 V) / I_rec(100 V) 0.00
Noise
mu μ 133.83
Vcal Threshold Width
RelativeGainWidth
PedestalSpread
mu μ 1253.50
Parameter1
mu μ 0.83
Temperature
Temperature Temp. while test -20.00 +/- 0.01 °C
Duration Duration of test 0:03:15
Summary ROCs
ROC Total Dead Mask Bumps Trim(Bits) Address Noise Thresh Gain Ped Par1
Chip 0 20 0 0 4 16 0 0 0 0 0 0
_