Test Date: 2014-02-17 16:02
Chip 0
Pixel Map: C0
SCurveWidths
Plot
N N 4159
mu μ 187.04
sigma σ 21.62
VcalThresholdUntrimmed
Vcal Threshold Trimmed
Plot
N N 4160
mu μ 39.96
sigma σ 2.01
Bump Bonding Problems: C0
Bump Bonding: C0
Plot
Mean Mean 58.55
RMS RMS 6.23
nSigma σ 5.0
Threshold threshold 89.69
nBumpBondingProblems N BumpProblems 2.0
Trim Bit Test
Summary
Total Total 139
nDeadPixel Dead Pixels 0
nNoisy1Pixel Noisy Pixels 1 0
nMaskDefect Mask Defects 0
nDeadBumps Dead Bumps 2
nDeadTrimbits Dead Trimbits 139
nAddressProblems Address Problems 0
nNoisy2Pixel Noisy Pixels 2 0
nThrDefect Trim Problems 0
nGainDefect PH Gain defects 0
nPedDefect PH Pedestal defects 0
nPar1Defect PH Parameter1 Defects 0
PixelDefectsGrade Pixel Defects Grade ROC 2
Address Decoding: C0
PHCalibrationGain
Plot
N N 3921
mu μ 5.18
sigma σ 0.12
over >= 238.00
Par1N Par1 N 4160
Par1mu Par1 μ 0.84
Par1sigma Par1 σ 0.04
PHCalibrationPedestal
Plot
N N 4159
mu μ 65.48
sigma σ 5.29
Trim Bits
PH Calibration Gain Map
OpParameters
Vana Vana 66 DAC
CalDel CalDel 136 DAC
VthrComp VthrComp 67 DAC
Vtrim Vtrim 29 DAC
Ibias_DAC Ibias_DAC 130 DAC
VoffsetOp VoffsetOp N/A DAC