Test Date: 2014-02-18 09:02
Chip 0
Pixel Map: C0
SCurveWidths
Plot
N N 4158
mu μ 198.51
sigma σ 25.01
VcalThresholdUntrimmed
Vcal Threshold Trimmed
Plot
N N 4160
mu μ 39.98
sigma σ 2.19
Bump Bonding Problems: C0
Bump Bonding: C0
Plot
Mean Mean 58.39
RMS RMS 5.95
nSigma σ 5.0
Threshold threshold 88.16
nBumpBondingProblems N BumpProblems 0.0
Trim Bit Test
Summary
Total Total 77
nDeadPixel Dead Pixels 0
nNoisy1Pixel Noisy Pixels 1 0
nMaskDefect Mask Defects 0
nDeadBumps Dead Bumps 0
nDeadTrimbits Dead Trimbits 77
nAddressProblems Address Problems 0
nNoisy2Pixel Noisy Pixels 2 0
nThrDefect Trim Problems 0
nGainDefect PH Gain defects 0
nPedDefect PH Pedestal defects 0
nPar1Defect PH Parameter1 Defects 0
PixelDefectsGrade Pixel Defects Grade ROC 2
Address Decoding: C0
PHCalibrationGain
Plot
N N 3511
mu μ 5.21
sigma σ 0.14
over >= 648.00
Par1N Par1 N 4159
Par1mu Par1 μ 0.89
Par1sigma Par1 σ 0.04
PHCalibrationPedestal
Plot
N N 4159
mu μ 67.65
sigma σ 5.28
Trim Bits
PH Calibration Gain Map
OpParameters
Vana Vana 71 DAC
CalDel CalDel 142 DAC
VthrComp VthrComp 72 DAC
Vtrim Vtrim 29 DAC
Ibias_DAC Ibias_DAC 130 DAC
VoffsetOp VoffsetOp N/A DAC