Test Date: 2014-02-17 11:02
Chip 0
Pixel Map: C0
SCurveWidths
Plot
N N 4160
mu μ 178.37
sigma σ 19.85
VcalThresholdUntrimmed
Vcal Threshold Trimmed
Plot
N N 4160
mu μ 40.07
sigma σ 1.76
Bump Bonding Problems: C0
Bump Bonding: C0
Plot
Mean Mean 47.87
RMS RMS 4.1
nSigma σ 5.0
Threshold threshold 68.37
nBumpBondingProblems N BumpProblems 1.0
Trim Bit Test
Summary
Total Total 3581
nDeadPixel Dead Pixels 0
nNoisy1Pixel Noisy Pixels 1 0
nMaskDefect Mask Defects 0
nDeadBumps Dead Bumps 1
nDeadTrimbits Dead Trimbits 3581
nAddressProblems Address Problems 0
nNoisy2Pixel Noisy Pixels 2 0
nThrDefect Trim Problems 0
nGainDefect PH Gain defects 0
nPedDefect PH Pedestal defects 0
nPar1Defect PH Parameter1 Defects 0
PixelDefectsGrade Pixel Defects Grade ROC 3
Address Decoding: C0
PHCalibrationGain
Plot
N N 4158
mu μ 4.13
sigma σ 0.16
under <= 1.00
Par1N Par1 N 4159
Par1mu Par1 μ 0.90
Par1sigma Par1 σ 0.03
PHCalibrationPedestal
Plot
N N 4158
mu μ 29.28
sigma σ 4.60
over >= 1.00
Trim Bits
PH Calibration Gain Map
OpParameters
Vana Vana 78 DAC
CalDel CalDel 131 DAC
VthrComp VthrComp 63 DAC
Vtrim Vtrim 29 DAC
Ibias_DAC Ibias_DAC 130 DAC
VoffsetOp VoffsetOp N/A DAC