Test Date: 2014-02-17 10:02
Chip 0
Pixel Map: C0
SCurveWidths
N N 4160
mu μ 179.61
sigma σ 24.81
VcalThresholdUntrimmed
Vcal Threshold Trimmed
N N 4160
mu μ 40.01
sigma σ 1.79
Bump Bonding Problems: C0
Bump Bonding: C0
Mean Mean 45.65
RMS RMS 4.1
nSigma σ 5.0
Threshold threshold 66.14
nBumpBondingProblems N BumpProblems 1.0
Trim Bit Test
Summary
Total Total 3786
nDeadPixel Dead Pixels 0
nNoisy1Pixel Noisy Pixels 1 0
nMaskDefect Mask Defects 0
nDeadBumps Dead Bumps 1
nDeadTrimbits Dead Trimbits 3786
nAddressProblems Address Problems 0
nNoisy2Pixel Noisy Pixels 2 0
nThrDefect Trim Problems 0
nGainDefect PH Gain defects 0
nPedDefect PH Pedestal defects 0
nPar1Defect PH Parameter1 Defects 0
PixelDefectsGrade Pixel Defects Grade ROC 3
Address Decoding: C0
PHCalibrationGain
N N 4006
mu μ 5.03
sigma σ 0.15
over >= 153.00
Par1N Par1 N 4160
Par1mu Par1 μ 0.80
Par1sigma Par1 σ 0.04
PHCalibrationPedestal
N N 4159
mu μ 54.81
sigma σ 4.66
Trim Bits
PH Calibration Gain Map
OpParameters
Vana Vana 85 DAC
CalDel CalDel 137 DAC
VthrComp VthrComp 60 DAC
Vtrim Vtrim 29 DAC
Ibias_DAC Ibias_DAC 130 DAC
VoffsetOp VoffsetOp N/A DAC